Riichiro Takaishi

According to our database, Riichiro Takaishi authored at least 2 papers between 2017 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Impact of specific failure mechanisms on endurance improvement for HfO2-based ferroelectric tunnel junction memory.

Marina Yamaguchi, Shosuke Fujii, Yuuichi Kamimuta, Shoichi Kabuyanagi, Tsunehiro Ino, Yasushi Nakasaki, Riichiro Takaishi, Reika Ichihara, Masumi Saitoh

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface.

Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe

Microelectron. Reliab., 2017