Simone Pampuri

Orcid: 0000-0002-0582-9892

According to our database1, Simone Pampuri authored at least 17 papers between 2010 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2018
A Fraud Detection Decision Support System via Human On-Line Behavior Characterization and Machine Learning.
Proceedings of the First International Conference on Artificial Intelligence for Industries, 2018

2016
Supervised Aggregative Feature Extraction for Big Data Time Series Regression.
IEEE Trans. Ind. Informatics, 2016

2015
Machine Learning for Predictive Maintenance: A Multiple Classifier Approach.
IEEE Trans. Ind. Informatics, 2015

Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach.
Comput. Oper. Res., 2015

2014
A sampling decision system for semiconductor manufacturing: relying on virtual metrology and actual measurements.
Proceedings of the 2014 Winter Simulation Conference, 2014

An adaptive machine learning decision system for flexible predictive maintenance.
Proceedings of the 2014 IEEE International Conference on Automation Science and Engineering, 2014

Insight extraction for semiconductor manufacturing processes.
Proceedings of the 2014 IEEE International Conference on Automation Science and Engineering, 2014

2013
Prediction of integral type failures in semiconductor manufacturing through classification methods.
Proceedings of 2013 IEEE 18th Conference on Emerging Technologies & Factory Automation, 2013

A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation.
Proceedings of the 2013 IEEE International Conference on Automation Science and Engineering, 2013

2012
Learning from time series: Supervised Aggregative Feature Extraction.
Proceedings of the 51th IEEE Conference on Decision and Control, 2012

An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control.
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012

Multistep virtual metrology approaches for semiconductor manufacturing processes.
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012

2011
Nonparametric Virtual Sensors for Semiconductor Manufacturing - Using Information Theoretic Learning and Kernel Machines.
Proceedings of the ICINCO 2011 - Proceedings of the 8th International Conference on Informatics in Control, Automation and Robotics, Volume 2, Noordwijkerhout, The Netherlands, 28, 2011

Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing.
Proceedings of the IEEE Conference on Automation Science and Engineering, 2011

Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing.
Proceedings of the IEEE Conference on Automation Science and Engineering, 2011

2010
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing.
Proceedings of the IEEE Conference on Automation Science and Engineering, 2010

Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing.
Proceedings of the IEEE Conference on Automation Science and Engineering, 2010


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