Soumya Mittal

According to our database, Soumya Mittal authored at least 12 papers between 2016 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Industry Evaluation of Reversible Scan Chain Diagnosis.

Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson

Proceedings of the IEEE International Test Conference, 2022

2020

Towards Smarter Diagnosis: A Learning-based Diagnostic Outcome Previewer.

Qicheng Huang, Chenlei Fang, Soumya Mittal, R. D. (Shawn) Blanton

ACM Trans. Design Autom. Electr. Syst., 2020

A Deterministic-Statistical Multiple-Defect Diagnosis Methodology.

Soumya Mittal, R. D. Shawn Blanton

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

2019

Diagnosis Outcome Preview through Learning.

Chenlei Fang, Qicheng Huang, Soumya Mittal, R. D. Shawn Blanton

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology.

Soumya Mittal, R. D. Shawn Blanton

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

NOIDA: Noise-resistant Intra-cell Diagnosis.

Soumya Mittal, R. D. (Shawn) Blanton

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Improving Diagnosis Efficiency via Machine Learning.

Qicheng Huang, Chenlei Fang, Soumya Mittal, R. D. Shawn Blanton

Proceedings of the IEEE International Test Conference, 2018

2017

Multiple-defect diagnosis for Logic Characterization Vehicles.

Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton

Proceedings of the 22nd IEEE European Test Symposium, 2017

PADLOC: Physically-Aware Defect Localization and Characterization.

Soumya Mittal, R. D. (Shawn) Blanton

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2016

Test chip design for optimal cell-aware diagnosability.

Soumya Mittal, Zeye Liu, Ben Niewenhuis, R. D. (Shawn) Blanton

Proceedings of the 2016 IEEE International Test Conference, 2016

Logic characterization vehicle design reflection via layout rewiring.

Phillip Fynan, Zeye Liu, Benjamin Niewenhuis, Soumya Mittal, Marcin Strajwas, R. D. (Shawn) Blanton

Proceedings of the 2016 IEEE International Test Conference, 2016

Achieving 100% cell-aware coverage by design.

Zeye Liu, Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016