Kun Young Chung

According to our database, Kun Young Chung authored at least 9 papers between 2003 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Industry Evaluation of Reversible Scan Chain Diagnosis.

Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson

Proceedings of the IEEE International Test Conference, 2022

2017

Innovative practices session 9C DFT and data for diagnostics.

Kun Young Chung, Stefano Di Carlo

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016

Comprehensive optimization of scan chain timing during late-stage IC implementation.

Kun Young Chung, Andrew B. Kahng, Jiajia Li

Proceedings of the 53rd Annual Design Automation Conference, 2016

Learning-based prediction of embedded memory timing failures during initial floorplan design.

Wei-Ting Jonas Chan, Kun Young Chung, Andrew B. Kahng, Nancy D. MacDonald, Siddhartha Nath

Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016

2014

Test Compression Improvement with EDT Channel Sharing in SoC Designs.

Yu Huang, Mark Kassab, Jay Jahangiri, Janusz Rajski, Wu-Tung Cheng, Dongkwan Han, Jihye Kim, Kun Young Chung

Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014

2010

Design and test of latch-based circuits to maximize performance, yield, and delay test quality.

Kun Young Chung, Sandeep K. Gupta

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Efficient Scheduling of Path Delay Tests for Latch-Based Circuits.

Kun Young Chung, Sandeep K. Gupta

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2006

Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing.

Kun Young Chung, Sandeep K. Gupta

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2003

Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing.

Kun Young Chung, Sandeep K. Gupta

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003