Szymon Kulis

According to our database, Szymon Kulis authored at least 7 papers between 2019 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Validity and Reliability of a Mobile Device Application for Assessing Motor Performance in the 30-Second Sit-to-Stand Test.

Eduardo Veloso Ferreira, Amélia Pasqual Marques, Szymon Kulis, Jan Gajewski, Anderson Antunes da Costa Moraes, Manuela Brito Duarte, Gizele Cristina da Silva Almeida, Enzo Gabriel da Rocha Santos, Gustavo Henrique Lima Pinto, André dos Santos Cabral, Givago Silva Souza, Anselmo de Athayde Costa e Silva, Bianca Callegari

IEEE Access, 2025

Silicon Photonics for Harsh Environments.

Daniele Alfiero, Sophie Baron, Mateusz Baszczyk, Stefan Biereigel, Stéphane Détraz, Adam Klekotko, Szymon Kulis, Francesco Martina, Paulo Moreira, Lauri Olanterä, Carmelo Scarcella, Christophe Sigaud, Csaba Soós, Jan Troska

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2025

2024

Intra and Inter-Device Reliabilities of the Instrumented Timed-Up and Go Test Using Smartphones in Young Adult Population.

Thâmela Thaís Santos dos Santos, Amélia Pasqual Marques, Luis Carlos Pereira Monteiro, Enzo Gabriel da Rocha Santos, Gustavo Henrique Lima Pinto, Anderson Belgamo, Anselmo de Athayde Costa e Silva, André dos Santos Cabral, Szymon Kulis, Jan Gajewski, Givago Silva Souza, Tacyla Jesus da Silva, Wesley Thyago Alves da Costa, Railson Cruz Salomão, Bianca Callegari

Sensors, May, 2024

2023

Smart-Redundancy With In Memory ECC Checking: Low-Power SEE-Resistant FPGA Architectures.

Aurélien Alacchi, Edouard Giacomin, Roman Gauchi, Szymon Kulis, Pierre-Emmanuel Gaillardon

IEEE Trans. Very Large Scale Integr. Syst., August, 2023

2020

A Low Noise Fault Tolerant Radiation Hardened 2.56 Gbps Clock-Data Recovery Circuit With High Speed Feed Forward Correction in 65 nm CMOS.

Stefan Biereigel, Szymon Kulis, Pedro Leitao, Rui Francisco, Paulo Moreira, Paul Leroux, Jeffrey Prinzie

IEEE Trans. Circuits Syst. I Fundam. Theory Appl., 2020

2019

A High-resolution, Wide-range, Radiation-hard Clock Phase-shifter in a 65 nm CMOS Technology.

Szymon Kulis, Dongxu Yang, Datao Ghong, Jose Fonseca, Stefan Biereigel, Jingbo Ye, Paulo Moreira

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

A Low Noise Fault Tolerant Radiation Hardened 2.56 Gbps Clock-Data Recovery Circuit with High Speed Feed Forward Correction in 65 nm CMOS.

Jeffrey Prinzie, Szymon Kulis, Pedro Leitao, Rui Francisco, Valentijn De Smedt, Paulo Moreira, Paul Leroux

Proceedings of the 10th IEEE Latin American Symposium on Circuits & Systems, 2019