Thomas Droniou

According to our database, Thomas Droniou authored at least 3 papers between 2008 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Horizontal-FPN fault coverage improvement in production test of CMOS imagers.

Richun Fei, Jocelyn Moreau, Salvador Mir, Alexis Marcellin, C. Mandier, E. Huss, G. Palmigiani, P. Vitrou, Thomas Droniou

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2009

Running scan test on three pins: yes we can!

Jocelyn Moreau, Thomas Droniou, Philippe Lebourg, Paul Armagnat

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

High Test Quality in Low Pin Count Applications.

Jayant D'Souza, Subramanian Mahadevan, Nilanjan Mukherjee, Graham Rhodes, Jocelyn Moreau, Thomas Droniou, Paul Armagnat, Damien Sartoretti

Proceedings of the 2008 IEEE International Test Conference, 2008