Thomas Pompl

According to our database1, Thomas Pompl authored at least 3 papers between 2005 and 2009.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2009
Reliability aspects of gate oxide under ESD pulse stress.
Microelectron. Reliab., 2009

2006
Practical aspects of reliability analysis for IC designs.
Proceedings of the 43rd Design Automation Conference, 2006

2005
Voltage acceleration of time-dependent breakdown of ultra-thin gate dielectrics.
Microelectron. Reliab., 2005


  Loading...