Thomas Pompl

According to our database, Thomas Pompl authored at least 3 papers between 2005 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Reliability aspects of gate oxide under ESD pulse stress.

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix

Microelectron. Reliab., 2009

2006

Practical aspects of reliability analysis for IC designs.

Thomas Pompl, Christian Schlünder, Martina Hommel, Heiko Nielen, Jens Schneider

Proceedings of the 43rd Design Automation Conference, 2006

2005

Voltage acceleration of time-dependent breakdown of ultra-thin gate dielectrics.

Thomas Pompl, Michael Röhner

Microelectron. Reliab., 2005