Kiran V. Chatty

According to our database, Kiran V. Chatty authored at least 8 papers between 2003 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology.

Tommaso Cilento, M. Schenkel, C. Yun, R. Mishra, Junjun Li, Kiran V. Chatty, Robert Gauthier

Microelectron. Reliab., 2010

2009

Reliability aspects of gate oxide under ESD pulse stress.

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix

Microelectron. Reliab., 2009

Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology.

David Alvarez, Kiran V. Chatty, Christian Russ, Michel J. Abou-Khalil, Junjun Li, Robert Gauthier, Kai Esmark, Ralph Halbach, Christopher Seguin

Microelectron. Reliab., 2009

2007

Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90 nm CMOS ASICs.

Ciaran J. Brennan, Shunhua Chang, Min Woo, Kiran V. Chatty, Robert Gauthier

Microelectron. Reliab., 2007

Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs.

Ciaran J. Brennan, Kiran V. Chatty, Jeff Sloan, Paul Dunn, Mujahid Muhammad, Robert Gauthier

Microelectron. Reliab., 2007

2006

Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant.

David Alvarez, Michel J. Abou-Khalil, Christian Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, Junjun Li, Christopher Seguin, Ralph Halbach

Microelectron. Reliab., 2006

2003

Latchup Analysis Using Emission Microscopy.

Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda, Philip Wu, Steve Wilson

Microelectron. Reliab., 2003

Optical and Electrical Testing of Latchup in I/O Interface Circuits.

Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003