Christian Schlünder

According to our database1, Christian Schlünder authored at least 9 papers between 2005 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2019
From Device Aging Physics to Automated Circuit Reliability Sign Off.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification.
Microelectron. Reliab., 2018

Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI.
Proceedings of the 48th European Solid-State Device Research Conference, 2018

2016
Degradation and recovery of variability due to BTI.
Microelectron. Reliab., 2016

2012
New insights on the PBTI phenomena in SiON pMOSFETs.
Microelectron. Reliab., 2012

2006
Practical aspects of reliability analysis for IC designs.
Proceedings of the 43rd Design Automation Conference, 2006

2005
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits.
Microelectron. Reliab., 2005


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