Christian Schlünder
According to our database1,
Christian Schlünder
authored at least 9 papers
between 2005 and 2023.
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Bibliography
2023
Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification.
Microelectron. Reliab., 2018
Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI.
Proceedings of the 48th European Solid-State Device Research Conference, 2018
2016
2012
2006
Proceedings of the 43rd Design Automation Conference, 2006
2005
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits.
Microelectron. Reliab., 2005