Vazgen Melikyan

According to our database, Vazgen Melikyan authored at least 44 papers between 2008 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Smart Adjustment Of Transistor Parameters To Reduce Temperature Rise Due To Self-Heating Effect.

Vazgen Melikyan, Petros Petrosyan, Narek Avagyan, Gor Abgaryan

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Physical Design of 6T Cell of SRAM Devices and Comparative Analysis of Layout.

Vazgen Melikyan, Armen Petrosyan

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Tuning Genetic Algorithm Parameters for Placement of Integrated Circuit Cells.

Vazgen Melikyan, Ashot Harutyunyan, Vachagan Davtyan, David Revazyan, Gevorg Harutyunyan

Proceedings of the IEEE East-West Design & Test Symposium, 2023

Accelerating CNN Models for Visual Odometry: Design and FPGA Implementation for Efficient Hardware Acceleration.

Vazgen Melikyan, Mushegh T. Grigoryan, Ashot Avetisyan, Tigran Khachatryan

Proceedings of the IEEE East-West Design & Test Symposium, 2023

2021

Enhanced pin-access prediction and design optimization with machine learning integration.

Suren Abazyan, Vazgen Melikyan

Microelectron. J., 2021

Design and Verification of Novel Sync Cell.

Vazgen Melikyan, Stepan Harutyunyan, Taron Kaplanyan, Artak Kirakosyan, Momjyan Arsen, Vardan Amiryan

Proceedings of the IEEE East-West Design & Test Symposium, 2021

UVM Verification IP for AXI.

Vazgen Melikyan, Stepan Harutyunyan, Artak Kirakosyan, Taron Kaplanyan

Proceedings of the IEEE East-West Design & Test Symposium, 2021

2019

Development of Method for Automation of SPICE Models Generation.

Vazgen Sh. Melikyan, Meruzhan K. Martirosyan, Diana A. Virabyan, Hakob T. Kostanyan

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

Power Supply Noise Rejection Improvement Method in Modern VLSI Design.

Vazgen Sh. Melikyan, Artur Kh. Mkhitaryan, Hakob T. Kostanyan, Hayk T. Grigoryan, T. Kostanyan Harutyun, Mushegh T. Grigoryan, Ruben H. Musayelyan, Hayk V. Margaryan

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

Unit Regression Test Selection Mechanism Based on Hashing Algorithm.

Vazgen Sh. Melikyan, Hovhannes H. Hakobyan, Taron Hovhannisyan, Momjyan Arsen

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

2018

Process Variation Detection and Self-Calibration Method for High-Speed Serial Links.

Vazgen Sh. Melikyan, Armen A. Martirosyan, Arthur S. Sahakyan, Zaven M. Avetisyan, Arman S. Trdatyan, Karen T. Khachikyan, Arman S. Petrosyan, Manvel T. Grigoryan

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

High Quality Factor 5.0 Gbps CTLE Circuit for SERDES Serial Links.

Vazgen Sh. Melikyan, Arshavir V. Matevosyan, Arman S. Petrosyan, Armen A. Martirosyan, Karen T. Khachikyan, Ruben H. Musayelyan, Arman S. Trdatyan, David K. Hakobyan

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

Transmitter Output Impedance Calibration Method.

Vazgen Sh. Melikyan, Andranik K. Hayrapetyan, Bagrat E. Baghramyan, Arman S. Trdatyan, Artur Kh. Mkhitaryan, Ara E. Mkrtchyan, Anush Z. Ramazyan, Shavarsh V. Melikyan

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

Low Power, Low Offset, Area Efficient Comparator Design in Nanoscale CMOS Technology.

Vazgen Sh. Melikyan, Vardan P. Grigoryants, Artur Kh. Mkhitaryan, Gegham A. Petrosyan, Andranik K. Hayrapetyan, Zaven M. Avetisyan, Simon H. Gharibyan, Nune H. Beglaryan

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

2017

P/G pad placement optimization in USB test chips.

Vazgen Sh. Melikyan, Karo H. Safaryan, F. A. Aslikyan

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

Temperature-aware interactive initial placement for integrated circuits.

Vazgen Sh. Melikyan, Ani G. Harutyunyan, T. A. Gasparyan

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

3D integrated circuits multifactor placement.

Vazgen Sh. Melikyan, Ani G. Harutyunyan

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

Line-impedance matching and signal conditioning capabilities for high-speed feed-forward voltage-mode transmit drivers.

Khaldoon Abugharbieh, Abraham Balabanyan, Armen Durgaryan, Vazgen Melikyan

Microelectron. J., 2016

Low power OpenRISC processor with power gating, multi-VTH and multi-voltage techniques.

Vazgen Melikyan, Tigran Hakhverdyan, Sergey Manukyan, Aram Gevorgyan, Davit Babayan

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

Analysis of the impact of metastability phenomenon on the latency and power consumption of synchronizer circuits.

Vazgen Melikyan, Eduard Babayan, Tigran Khazhakyan, Sergey Manukyan

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015

Accurate reference current generation method and circuit in CMOS.

Edvard Mkrtchyan, Armen A. Martirosyan, A. Asatryan, Vazgen Melikyan, Davit Babayan, N. Melikyan

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

Low power duty cycle adjustment simple method in high speed serial links.

Vazgen Melikyan, Arthur S. Sahakyan, Arsen Hekimyan, Davit Trdatyan, Aram Shishmanyan, Tigran Khazhakyan

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

Clock gating and multi-VTH low power design methods based on 32/28 nm ORCA processor.

Vazgen Melikyan, Eduard Babayan, Anush Melikyan, Davit Babayan, Poghos Petrosyan, Edvard Mkrtchyan

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

2014

Pull-up/pull-down line impedance matching methodology for high speed transmitters.

Armen Durgaryan, Abraham Balabanyan, Vazgen Melikyan, Khaldoon Abugharbieh

Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

Synopsys' Educational Generic Memory Compiler.

Richard Goldman, Karen Bartleson, Troy Wood, Vazgen Melikyan, Eduard Babayan

Proceedings of the 10th European Workshop on Microelectronics Education (EWME), 2014

Resistance calibration method without external precision elements.

Vazgen Sh. Melikyan, Arthur S. Sahakyan, Mikayel Piloyan, Gagik Hovhannisyan, Aram Shishmanyan, Taron Hovhannisyan, Davit Trdatyan

Proceedings of the 2014 East-West Design & Test Symposium, 2014

Modified fast PCA algorithm on GPU architecture.

Vazgen Sh. Melikyan, Hasmik Osipyan

Proceedings of the 2014 East-West Design & Test Symposium, 2014

Design of low-ripple multi-topology step-down switched capacitor power converter with adaptive control system.

Vazgen Melikyan, Vache Galstyan

Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013

PVT variation detection and compensation methods for high-speed systems.

Vazgen Melikyan, Abraham Balabanyan, Armen Durgaryan, Harutyun Stepanyan, Karen Sloyan, Hovik Musayelyan, Gayane Markosyan

Proceedings of the 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, 2013

High accuracy equalization method for receiver active equalizer.

Vazgen Sh. Melikyan, Arthur S. Sahakyan, Karo H. Safaryan, Hayk H. Dingchyan

Proceedings of the East-West Design & Test Symposium, 2013

Self-calibration method for capacitor mismatch elimination.

Vazgen Melikyan, Harutyun Stepanyan, Ani Aleksanyan, Ani Harutyunyan, Armen Durgaryan

Proceedings of the East-West Design & Test Symposium, 2013

Low-voltage compatible linear voltage ramp generator for zero-crossing-based integrators.

Vazgen Sh. Melikyan, Hayk H. Dingchyan, Arthur S. Sahakyan, Vardan P. Grigoryants, Karo H. Safaryan

Proceedings of the East-West Design & Test Symposium, 2013

Self compensating low noise low power PLL design.

Vazgen Melikyan, Armen Durgaryan, Ararat Khachatryan, Hayk Manukyan, Eduard Musaelyan

Proceedings of the East-West Design & Test Symposium, 2013

Noise effect estimation and reduction in high-speed voltage controlled oscillators.

Vazgen Melikyan, Abraham Balabanyan, Armen Durgaryan

Proceedings of the East-West Design & Test Symposium, 2013

2012

Investigating the effects of Inverted Temperature Dependence (ITD) on clock distribution networks.

Alessandro Sassone, Andrea Calimera, Alberto Macii, Enrico Macii, Massimo Poncino, Richard Goldman, Vazgen Melikyan, Eduard Babayan, Salvatore Rinaudo

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

Digital circuits verification with consideration of destabilizing factors.

Richard Goldman, Vazgen Melikyan, Eduard Babayan

Proceedings of the 6th IEEE International Design and Test Workshop, 2011

Programmable current biasing for low noise voltage controlled oscillators.

Vazgen Melikyan, Armen Durgaryan

Proceedings of the 9th East-West Design & Test Symposium, 2011

2010

5V tolerant power clamps for mixed-voltage IC's in 65nm 2.5V salicided CMOS technology.

Vazgen Melikyan, Karen Sahakyan, Armen Nazaryan

Proceedings of the 2010 East-West Design & Test Symposium, 2010

A process variation detection method.

Vazgen Melikyan, Davit Mirzoyan, Gor Petrosyan

Proceedings of the 2010 East-West Design & Test Symposium, 2010

Stable current and voltage generation under process variation.

Vazgen Melikyan, S. Karapetyan, Davit Mirzoyan, Eduard Babayan

Proceedings of the 2010 East-West Design & Test Symposium, 2010

Schematic protection method from influence of total ionization dose effects on threshold voltage of MOS transistors.

Vazgen Melikyan, Aristakes Hovsepyan, Tigran Harutyunyan

Proceedings of the 2010 East-West Design & Test Symposium, 2010

2009

Full-custom design project for digital VLSI and IC design courses using synopsys generic 90nm CMOS library.

Eli Lyons, Vish Ganti, Richard Goldman, Vazgen Melikyan, Hamid Mahmoodi

Proceedings of the IEEE International Conference on Microelectronic Systems Education, 2009

Synopsys' open educational design kit: Capabilities, deployment and future.

Richard Goldman, Karen Bartleson, Troy Wood, Kevin Kranen, C. Cao, Vazgen Melikyan, Gayane Markosyan

Proceedings of the IEEE International Conference on Microelectronic Systems Education, 2009

2008

Digital lock detector for PLL.

Vazgen Melikyan, Aristakes Hovsepyan, Mkrtich Ishkhanyan, Tigran Hakobyan

Proceedings of the 2008 East-West Design & Test Symposium, 2008