Victor P. Nelson

According to our database, Victor P. Nelson authored at least 22 papers between 1980 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2017

CE2016: Updated curricular guidelines for computer engineering.

Victor P. Nelson, Eric Durant, John Impagliazzo, Joseph L. A. Hughes

Proceedings of the 2017 IEEE Frontiers in Education Conference, 2017

2015

CE2016 steering committee: a short update.

Susan Conry, Eric Durant, Herman Lam, Victor P. Nelson, Robert B. Reese

Inroads, 2015

CE2016: Updated computer engineering curriculum guidelines.

Eric Durant, John Impagliazzo, Susan Conry, Robert B. Reese, Herman Lam, Victor P. Nelson, Joseph L. Hughes, Weidong Liu, Junlin Lu, Andrew D. McGettrick

Proceedings of the 2015 IEEE Frontiers in Education Conference, 2015

2014

Setting the stage for CE2016: A revised body of knowledge.

Eric Durant, John Impagliazzo, Susan Conry, Robert B. Reese, Mitchell A. Thornton, Herman Lam, Victor P. Nelson

Proceedings of the IEEE Frontiers in Education Conference, 2014

2009

Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems.

George J. Starr, Jie Qin, Bradley F. Dutton, Charles E. Stroud, Foster F. Dai, Victor P. Nelson

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

Application of Embedded Systems in Low Earth Orbit for Measurement of Ionospheric Anomalies.

George J. Starr, J. M. Wersinger, Richard Chapman, Lloyd Riggs, Victor P. Nelson, John Klingelhoeffer, Charles E. Stroud

Proceedings of the 2009 International Conference on Embedded Systems & Applications, 2009

2003

Extending integrated-circuit yield-models to estimate early-life reliability.

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson

IEEE Trans. Reliab., 2003

2001

Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model.

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Estimating burn-in fall-out for redundant memory.

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

Yield-Reliability Modeling for Fault Tolerant Integrated Circuits.

Thomas S. Barnett, Adit D. Singh, Victor P. Nelson

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

1998

An IDDQ sensor for concurrent timing error detection.

Christopher G. Knight, Adit D. Singh, Victor P. Nelson

IEEE J. Solid State Circuits, 1998

1997

Which tester is right for your MCM?

Victor P. Nelson

IEEE Des. Test Comput., 1997

1991

Petri net performance modeling of a modified mesh-connected parallel computer.

Chia-Jiu Wang, Victor P. Nelson

Parallel Comput., 1991

A Study of the Generalized Multiple Bus-Connected Parallel Computer.

Chia-Jiu Wang, Chwan-Hwa John Wu, Victor P. Nelson

Comput. J., 1991

1990

Fault-Tolerant Computing: Fundamental Concepts.

Victor P. Nelson

Computer, 1990

1989

Performance modeling of the modified mesh-connected parallel computer.

Chia-Jiu Wang, Victor P. Nelson, Chwan-Hwa John Wu

Proceedings of the 9th International Conference on Distributed Computing Systems, 1989

1988

Failure dependent bandwidth in shuffle-exchange networks.

Charles R. Bisbee, Victor P. Nelson

IEEE Trans. Computers, 1988

1982

New Products.

Victor P. Nelson

IEEE Micro, 1982

1981

Interference Analysis of Shuffle/Exchange Networks.

Suchai Thanawastien, Victor P. Nelson

IEEE Trans. Computers, 1981

A Microcomputer-Based Controller for an Amusement Park Ride.

Victor P. Nelson, Hugh L. Fellows

IEEE Micro, 1981

Digital Filter Implementation on 16-Bit Microcomputers.

H. Troy Nagle, Victor P. Nelson

IEEE Micro, 1981

1980

A Reconfigurable Distributed Digital Filter.

D. V. Satishchandra, Victor P. Nelson

Proceedings of the Distributed Data Acquisition, Computing, and Control Symposium, 1980