Wen-Hsiang Chang

According to our database, Wen-Hsiang Chang authored at least 8 papers between 2010 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Power Distribution Network Generation for Optimizing IR-Drop Aware Timing.

Wen-Hsiang Chang, Li-Yi Lin, Yu-Guang Chen, Mango C.-T. Chao

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020

2017

Generating Routing-Driven Power Distribution Networks With Machine-Learning Technique.

Wen-Hsiang Chang, Chien-Hsueh Lin, Szu-Pang Mu, Li-De Chen, Cheng-Hong Tsai, Yen-Chih Chiu, Mango C.-T. Chao

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques.

Tzu-Hsuan Huang, Wei-Tse Hung, Hao-Yu Yang, Wen-Hsiang Chang, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao

Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016

Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax.

Szu-Pang Mu, Wen-Hsiang Chang, Mango C.-T. Chao, Yi-Ming Wang, Ming-Tung Chang, Min-Hsiu Tsai

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

2014

Practical Routability-Driven Design Flow for Multilayer Power Networks Using Aluminum-Pad Layer.

Wen-Hsiang Chang, Mango Chia-Tso Chao, Shi-Hao Chen

IEEE Trans. Very Large Scale Integr. Syst., 2014

An Emergency System in Mobile Devices.

Chung-Hua Chu, Wen-Hsiang Chang

Proceedings of the Trends and Applications in Knowledge Discovery and Data Mining, 2014

2013

Testing retention flip-flops in power-gated designs.

Hao-Wen Hsu, Shih-Hua Kuo, Wen-Hsiang Chang, Shi-Hao Chen, Ming-Tung Chang, Mango Chia-Tso Chao

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

2010

Mask versus Schematic - an enhanced design-verification flow for first silicon success.

Tseng-Chin Luo, Eric Leong, Mango Chia-Tso Chao, Philip A. Fisher, Wen-Hsiang Chang

Proceedings of the 2011 IEEE International Test Conference, 2010