Jih-Nung Lee

According to our database1, Jih-Nung Lee authored at least 13 papers between 2003 and 2020.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2020
CNN-based Stochastic Regression for IDDQ Outlier Identification.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

2019
Layout-Based Dual-Cell-Aware Tests.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Methodology of Generating Timing-Slack-Based Cell-Aware Tests.
Proceedings of the IEEE International Test Conference, 2019

2018
A Model-Based-Random-Forest Framework for Predicting V<sub>t</sub> Mean and Variance Based on Parallel I<sub>d</sub> Measurement.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

2017
Methodology of generating dual-cell-aware tests.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques.
Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016
Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015
Case study of process and design performance debugging with Digital Speed Sensor.
Proceedings of the VLSI Design, Automation and Test, 2015

2014
Physical-aware systematic multiple defect diagnosis.
IET Comput. Digit. Tech., 2014

2013
Case study of yield learning through in-house flow of volume diagnosis.
Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013

2009
A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design.
Proceedings of the 2009 IEEE International Test Conference, 2009

2003
Fault Pattern Oriented Defect Diagnosis for Memories.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

FAME: A Fault-Pattern Based Memory Failure Analysis Framework.
Proceedings of the 2003 International Conference on Computer-Aided Design, 2003


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