Ying-Yen Chen

According to our database¹, Ying-Yen Chen authored at least 23 papers between 2005 and 2023.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Timeline

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Links

On csauthors.net:

Bibliography

2023

CNN-Based Stochastic Regression for IDDQ Outlier Identification.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023

2022

Methodology of Generating Timing-Slack-Based Cell-Aware Tests.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Improving Cell-Aware Test for Intra-Cell Short Defects.

[BibT_eX]

[DOI]

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks.

[BibT_eX]

[DOI]

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2020

CNN-based Stochastic Regression for IDDQ Outlier Identification.

[BibT_eX]

[DOI]

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

2019

Layout-Based Dual-Cell-Aware Tests.

[BibT_eX]

[DOI]

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

2018

A Model-Based-Random-Forest Framework for Predicting V<sub>t</sub> Mean and Variance Based on Parallel I<sub>d</sub> Measurement.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

2017

Methodology of generating dual-cell-aware tests.

[BibT_eX]

[DOI]

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques.

[BibT_eX]

[DOI]

Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016

Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.

[BibT_eX]

[DOI]

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2014

Divide and conquer diagnosis for multiple defects.

[BibT_eX]

[DOI]

Proceedings of the 2014 International Test Conference, 2014

2013

Fuzzy Flexible Delivery and Pickup Problem with Time Windows.

[BibT_eX]

[DOI]

Ying-Yen Chen

Proceedings of the First International Conference on Information Technology and Quantitative Management, 2013

2012

A genetic algorithm for the simultaneous delivery and pickup problems with time window.

[BibT_eX]

[DOI]

Hsiao-Fan Wang

Ying-Yen Chen

Comput. Ind. Eng., 2012

2011

Diagnosis-assisted supply voltage configuration to increase performance yield of cell-based designs.

[BibT_eX]

[DOI]

Proceedings of the 16th Asia South Pacific Design Automation Conference, 2011

2010

Automatic Test Wrapper Synthesis for a Wireless ATE Platform.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2010

2009

A Non-Intrusive and Accurate Inspection Method for Segment Delay Variabilities.

[BibT_eX]

[DOI]

Ying-Yen Chen

Jing-Jia Liou

Proceedings of the Eighteentgh Asian Test Symposium, 2009

Multiple-Core under Test Architecture for HOY Wireless Testing Platform.

[BibT_eX]

[DOI]

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Diagnosis Framework for Locating Failed Segments of Path Delay Faults.

[BibT_eX]

[DOI]

Ying-Yen Chen

Jing-Jia Liou

IEEE Trans. Very Large Scale Integr. Syst., 2008

2007

Handling Pattern-Dependent Delay Faults in Diagnosis.

[BibT_eX]

[DOI]

Jyun-Wei Chen

Ying-Yen Chen

Jing-Jia Liou

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

A prototype of a wireless-based test system.

[BibT_eX]

[DOI]

Proceedings of the 2007 IEEE International SOC Conference, 2007

Extraction of Statistical Timing Profiles Using Test Data.

[BibT_eX]

[DOI]

Ying-Yen Chen

Jing-Jia Liou

Proceedings of the 44th Design Automation Conference, 2007

2006

Enhancing Diagnosis Resolution For Delay Faults By Path Extension Method.

[BibT_eX]

[DOI]

Ying-Yen Chen

Jing-Jia Liou

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005

Diagnosis framework for locating failed segments of path delay faults.

[BibT_eX]

[DOI]

Ying-Yen Chen

Min-Pin Kuo

Jing-Jia Liou

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Ying-Yen Chen

Timeline

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Links

On csauthors.net:

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