Xhesila Xhafa

According to our database, Xhesila Xhafa authored at least 9 papers between 2021 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

SRAM Periphery Testing Using the Cell-Aware Test Methodology.

Xhesila Xhafa, Eric Faehn, Patrick Girard, Arnaud Virazel

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2025

A Digital SRAM Modeling for Cell-Aware Testing and Test Algorithms Evaluation.

D. Ronga, Xhesila Xhafa, Eric Faehn, Patrick Girard, T. Vayssade, Arnaud Virazel

Proceedings of the 31st IEEE International Symposium on On-Line Testing and Robust System Design, 2025

A Runtime Efficient Graph-Based Cell-Aware Model Generation for Structural SRAM Testing.

Gianmarco Mongelli, Xhesila Xhafa, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel

Proceedings of the 31st IEEE International Symposium on On-Line Testing and Robust System Design, 2025

2024

A Graph-Based Methodology for Speeding up Cell-Aware Model Generation.

Gianmarco Mongelli, Xhesila Xhafa, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel

Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024

Producing a Bidirectional ATPG Compliant Verilog-HDL Memory Model of SRAM.

D. Ronga, Xhesila Xhafa, Eric Faehn, Patrick Girard, Thibault Vayssade, Arnaud Virazel

Proceedings of the IEEE International Conference on Design, 2024

A Structural Testing Approach for SRAM Address Decoders Using Cell-Aware Methodology.

Xhesila Xhafa, Eric Faehn, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023

On Using Cell-Aware Methodology for SRAM Bit Cell Testing.

Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory di Pendina, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE European Test Symposium, 2023

Learning-Based Characterization Models for Quality Assurance of Emerging Memory Technologies.

Xhesila Xhafa, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE European Test Symposium, 2023

2021

An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors.

Xhesila Xhafa, Ali Dogus Güngördü, Didem Erol, Yavuzhan Yavuz, Mustafa Berke Yelten

IEEE Trans. Instrum. Meas., 2021