Xhesila Xhafa
Orcid: 0000-0001-8951-7580
According to our database1,
Xhesila Xhafa
authored at least 3 papers
between 2021 and 2023.
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Bibliography
2023
Proceedings of the IEEE European Test Symposium, 2023
Learning-Based Characterization Models for Quality Assurance of Emerging Memory Technologies.
Proceedings of the IEEE European Test Symposium, 2023
2021
An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors.
IEEE Trans. Instrum. Meas., 2021