Yannick Monnet

According to our database, Yannick Monnet authored at least 9 papers between 2004 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2009

Comparing transient-fault effects on synchronous and on asynchronous circuits.

Rodrigo Possamai Bastos, Yannick Monnet, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2007

Formal Analysis of Quasi Delay Insensitive Circuits Behavior in the Presence of SEUs.

Yannick Monnet, Marc Renaudin, Régis Leveugle

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Designing Resistant Circuits against Malicious Faults Injection Using Asynchronous Logic.

Yannick Monnet, Marc Renaudin, Régis Leveugle

IEEE Trans. Computers, 2006

Asynchronous Design: Fault Robustness and Security Characteristics.

Marc Renaudin, Yannick Monnet

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Practical Evaluation of Fault Countermeasures on an Asynchronous DES Crypto Processor.

Yannick Monnet, Marc Renaudin, Régis Leveugle, Nathalie Feyt, Pascal Moitrel, F. M'Buwa Nzenguet

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Case Study of a Fault Attack on Asynchronous DES Crypto-Processors.

Yannick Monnet, Marc Renaudin, Régis Leveugle, Christophe Clavier, Pascal Moitrel

Proceedings of the Fault Diagnosis and Tolerance in Cryptography, 2006

2005

Hardening Techniques against Transient Faults for Asynchronous Circuits.

Yannick Monnet, Marc Renaudin, Régis Leveugle

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

Asynchronous circuits transient faults sensitivity evaluation.

Yannick Monnet, Marc Renaudin, Régis Leveugle

Proceedings of the 42nd Design Automation Conference, 2005

2004

Asynchronous Circuits Sensitivity to Fault Injection.

Yannick Monnet, Marc Renaudin, Régis Leveugle

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004