Rodrigo Possamai Bastos
Orcid: 0000-0002-9964-0424
According to our database1,
Rodrigo Possamai Bastos
authored at least 39 papers
between 2005 and 2021.
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Bibliography
2021
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021
2020
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Assessment of Machine Learning Algorithms for Near-Sensor Computing under Radiation Soft Errors.
Proceedings of the 27th IEEE International Conference on Electronics, Circuits and Systems, 2020
2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
2018
Microelectron. Reliab., 2018
A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems.
Microelectron. Reliab., 2018
Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits.
Microelectron. J., 2018
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits.
Proceedings of the 2018 International Symposium on Physical Design, 2018
Level Shifter Architecture for Dynamically Biasing Ultra-Low Voltage Subcircuits of Integrated Systems.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
2017
Microelectron. Reliab., 2017
Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors.
Microelectron. Reliab., 2017
Proceedings of the 14th International Conference on Synthesis, 2017
Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in Sensors.
Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation.
Proceedings of the Euromicro Conference on Digital System Design, 2017
A Practical Framework for Specification, Verification, and Design of Self-Timed Pipelines.
Proceedings of the 23rd IEEE International Symposium on Asynchronous Circuits and Systems, 2017
2016
New asynchronous protocols for enhancing area and throughput in bundled-data pipelines.
Proceedings of the 29th Symposium on Integrated Circuits and Systems Design, 2016
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016
Proceedings of the Second International Conference on Event-based Control, 2016
Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016
2015
Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology.
Microelectron. Reliab., 2015
2014
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.
Microelectron. Reliab., 2014
2013
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection.
Microelectron. Reliab., 2013
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic.
J. Electron. Test., 2013
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults.
Proceedings of the 2013 23rd International Workshop on Power and Timing Modeling, 2013
Proceedings of the 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, 2013
2012
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode.
Microelectron. Reliab., 2012
Proceedings of the 25th Symposium on Integrated Circuits and Systems Design, 2012
2011
Proceedings of the 12th Latin American Test Workshop, 2011
A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies.
Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011
2010
Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies.
Microelectron. Reliab., 2010
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
2009
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009
2006
Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates.
Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design, 2006
Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006
2005
Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory.
Proceedings of the Integrated Circuit and System Design, 2005