Rodrigo Possamai Bastos

According to our database1, Rodrigo Possamai Bastos authored at least 31 papers between 2005 and 2018.

Collaborative distances:



In proceedings 
PhD thesis 




Assessing body built-in current sensors for detection of multiple transient faults.
Microelectronics Reliability, 2018

A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems.
Microelectronics Reliability, 2018

Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits.
Microelectronics Journal, 2018

Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits.
Proceedings of the 2018 International Symposium on Physical Design, 2018

Level Shifter Architecture for Dynamically Biasing Ultra-Low Voltage Subcircuits of Integrated Systems.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

Non-intrusive testing technique for detection of Trojans in asynchronous circuits.
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

Method for evaluation of transient-fault detection techniques.
Microelectronics Reliability, 2017

Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors.
Microelectronics Reliability, 2017

Importance of IR drops on the modeling of laser-induced transient faults.
Proceedings of the 14th International Conference on Synthesis, 2017

Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in Sensors.
Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017

Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation.
Proceedings of the Euromicro Conference on Digital System Design, 2017

A Practical Framework for Specification, Verification, and Design of Self-Timed Pipelines.
Proceedings of the 23rd IEEE International Symposium on Asynchronous Circuits and Systems, 2017

New asynchronous protocols for enhancing area and throughput in bundled-data pipelines.
Proceedings of the 29th Symposium on Integrated Circuits and Systems Design, 2016

Comparison of low-voltage scaling in synchronous and asynchronous FD-SOI circuits.
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016

Simple tri-state logic Trojans able to upset properties of ring oscillators.
Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016

Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology.
Microelectronics Reliability, 2015

Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.
Microelectronics Reliability, 2014

Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection.
Microelectronics Reliability, 2013

A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic.
J. Electronic Testing, 2013

A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults.
Proceedings of the 2013 23rd International Workshop on Power and Timing Modeling, 2013

A bulk built-in sensor for detection of fault attacks.
Proceedings of the 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, 2013

Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode.
Microelectronics Reliability, 2012

Robust modular Bulk Built-in Current Sensors for detection of transient faults.
Proceedings of the 25th Symposium on Integrated Circuits and Systems Design, 2012

A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies.
Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies.
Microelectronics Reliability, 2010

Evaluating transient-fault effects on traditional C-element's implementations.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Design of a soft-error robust microprocessor.
Microelectronics Journal, 2009

Comparing transient-fault effects on synchronous and on asynchronous circuits.
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates.
Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design, 2006

Design of a Robust 8-Bit Microprocessor to Soft Errors.
Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory.
Proceedings of the Integrated Circuit and System Design, 2005