Yen-Tzu Lin

According to our database, Yen-Tzu Lin authored at least 9 papers between 2008 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Stair-Walking Performance in Adolescents with Intellectual Disabilities.

Wann-Yun Shieh, Yan-Ying Ju, Yu-Chun Yu, Che-Kuan Lin, Yen-Tzu Lin, Hsin-Yi Kathy Cheng

Sensors, 2016

2014

Innovative practices session 2C: Advanced in yield learning.

Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

2012

Physically-Aware N-Detect Test.

Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2011

METER: Measuring Test Effectiveness Regionally.

Yen-Tzu Lin, R. D. (Shawn) Blanton

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

2009

Controlling DPPM through Volume Diagnosis.

Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Physically-Aware N-Detect Test Relaxation.

Yen-Tzu Lin, Chukwuemeka U. Ezekwe, Ronald D. Blanton

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Test effectiveness evaluation through analysis of readily-available tester data.

Yen-Tzu Lin, Ronald D. Blanton

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon.

Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar

Proceedings of the 2008 IEEE International Test Conference, 2008

Physically-Aware N-Detect Test Pattern Selection.

Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton

Proceedings of the Design, Automation and Test in Europe, 2008