Yeohyeok Yun

According to our database, Yeohyeok Yun authored at least 2 papers in 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress.

Yeohyeok Yun, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

Microelectron. Reliab., 2018

Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.

Yeohyeok Yun, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

Microelectron. Reliab., 2018