Ji-Hoon Seo

According to our database, Ji-Hoon Seo authored at least 7 papers between 2013 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress.

Yeohyeok Yun, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

Microelectron. Reliab., 2018

Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.

Yeohyeok Yun, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

Microelectron. Reliab., 2018

2017

Analysis of the Elements of Future Development of Korean Style Software Education Through the Opinion Mining Technique.

Ji-Hoon Seo, Kil-Hong Joo

Proceedings of the Advances in Computer Science and Ubiquitous Computing, 2017

Analysis of Agenda Prediction According to Big Data Based Creative Education Performance Factors.

Ji-Hoon Seo, EunMi Cho, Kil-Hong Joo

Proceedings of the Advances in Computer Science and Ubiquitous Computing, 2017

2016

Channel width dependence of AC stress on bulk nMOSFETs.

Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang

Microelectron. Reliab., 2016

Degradation of pMOSFETs due to hot electron induced punchthrough.

Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang

Microelectron. Reliab., 2016

2013

Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs.

Seonhaeng Lee, Cheolgyu Kim, Hyeokjin Kim, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

Microelectron. Reliab., 2013