Bongkoo Kang

Modularized Design of Active Charge Equalizer for Li-Ion Battery Pack.

[BibT_eX]

[DOI]

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IEEE Trans. Ind. Electron., 2018

Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress.

[BibT_eX]

[DOI]

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Microelectron. Reliab., 2018

Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.

[BibT_eX]

[DOI]

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Microelectron. Reliab., 2018

Active Balancing of Li-Ion Battery Cells Using Transformer as Energy Carrier.

[BibT_eX]

[DOI]

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IEEE Trans. Ind. Electron., 2017

Fast and accurate method of lifetime estimation for HfSiON/SiO<sub>2</sub> dielectric n-MOSFETs under positive bias temperature instability.

[BibT_eX]

[DOI]

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Microelectron. Reliab., 2017

Channel width dependence of AC stress on bulk nMOSFETs.

[BibT_eX]

[DOI]

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Microelectron. Reliab., 2016

Degradation of pMOSFETs due to hot electron induced punchthrough.

[BibT_eX]

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Microelectron. Reliab., 2016

Active Cell Balancing of Li-Ion Batteries Using LC Series Resonant Circuit.

[BibT_eX]

[DOI]

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IEEE Trans. Ind. Electron., 2015

Voltage dependent degradation of HfSiON/SiO<sub>2</sub> nMOSFETs under positive bias temperature instability.

[BibT_eX]

[DOI]

Cheolgyu Kim

,

Hyeokjin Kim

,

Bongkoo Kang

Microelectron. Reliab., 2014

Power-efficient drive circuit for plasma display panel.

[BibT_eX]

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Displays, 2014

Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs.

[BibT_eX]

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Microelectron. Reliab., 2013

Improvement of Power-Conversion Efficiency of a DC-DC Boost Converter Using a Passive Snubber Circuit.

[BibT_eX]

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IEEE Trans. Ind. Electron., 2012

Channel width dependence of mechanical stress effects induced by shallow trench isolation on device performance of nanoscale nMOSFETs.

[BibT_eX]

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Microelectron. Reliab., 2012

Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs.

[BibT_eX]

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Microelectron. Reliab., 2012

Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress.

[BibT_eX]

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Microelectron. Reliab., 2012

Biased scan of plasma display panel for data voltage reduction.

[BibT_eX]

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Displays, 2012

Method of controlling external electrode fluorescent lamps for local dimming of liquid crystal displays.

[BibT_eX]

[DOI]

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Displays, 2011

Distributed circuit model for cold cathode fluorescent lamps in back-light unit of liquid crystal display.

[BibT_eX]

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Displays, 2010

Bipolar drive waveform for long-gap high-Xe plasma display panels.

[BibT_eX]

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Displays, 2010

Influence of wall charge on image sticking phenomena in AC plasma display panels.

[BibT_eX]

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Displays, 2009

Floating single sustain drive method for AC plasma display panel.

[BibT_eX]

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Displays, 2009

Influence of wall charge distribution on time lag of address discharge in AC plasma display panels.

[BibT_eX]

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Displays, 2008

Improvement of picture quality of high Xe content plasma display panels based on facing discharge suppression.

[BibT_eX]

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Displays, 2007

Effect of single crystalline MgO powder treatment of phosphor surface on discharge property of high-Xe AC plasma display panels.

[BibT_eX]

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Displays, 2007

Cell parameter extraction method for AC plasma display panels.

[BibT_eX]

[DOI]

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Displays, 2006

Versatile energy recovery circuit for driving AC plasma display panel with single sustain circuit board.

[BibT_eX]

[DOI]

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Displays, 2006

Drive waveform for high resolution and high Xe content AC plasma display panels.

[BibT_eX]

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Displays, 2005

Laminated magnetic flux sensor for thick-steel-plate control.

[BibT_eX]

[DOI]

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IEEE Trans. Ind. Electron., 2003

Bongkoo Kang

Bibliography

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