Yi-Kan Cheng

According to our database, Yi-Kan Cheng authored at least 14 papers between 1995 and 2012.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2012

Configurable analog routing methodology via technology and design constraint unification.

Po-Cheng Pan, Hung-Ming Chen, Yi-Kan Cheng, Jill Liu, Wei-Yi Hu

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

Efficient trimmed-sample Monte Carlo methodology and yield-aware design flow for analog circuits.

Chin-Cheng Kuo, Wei-Yi Hu, Yi-Hung Chen, Jui-Feng Kuan, Yi-Kan Cheng

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

2007

A New Flexible Algorithm for Random Yield Improvement.

Subarna Sinha, Qing Su, Linni Wen, Frank Lee, Charles C. Chiang, Yi-Kan Cheng, Jin-Lien Lin, Yu-Chyi Harn

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2000

A temperature-aware simulation environment for reliable ULSI chipdesign.

Yi-Kan Cheng, Sung-Mo Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

Application-Based, Transistor-Level Full-Chip Power Analysis for 700 MHz PowerPC^TM Microprocessor.

Yi-Kan Cheng, David Bearden, Kanti Suryadevara

Proceedings of the IEEE International Conference On Computer Design: VLSI In Computers & Processors, 2000

1999

Temperature-driven power and timing analysis for CMOS ULSI circuits.

Yi-Kan Cheng, Sung-Mo Kang

Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30, 1999

An efficient method for hot-spot identification in ULSI circuits.

Yi-Kan Cheng, Sung-Mo Kang

Proceedings of the 1999 IEEE/ACM International Conference on Computer-Aided Design, 1999

1998

ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips.

Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998

1997

Electrothermal Simulation and Temperature-Sensitive Reliability Diagnosis for CMOS VLSI Circuits

Yi-Kan Cheng

PhD thesis, 1997

iTEM: a temperature-dependent electromigration reliability diagnosis tool.

Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

1996

ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits.

Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang

Proceedings of the 1996 European Design and Test Conference, 1996

Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects.

Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang

Proceedings of the 33st Conference on Design Automation, 1996

iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips.

Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang

Proceedings of the 33st Conference on Design Automation, 1996

1995

Chip-Level Thermal Simulator to Predict VLSI Chip Temperature.

Yi-Kan Cheng, Sung-Mo Kang

Proceedings of the 1995 IEEE International Symposium on Circuits and Systems, ISCAS 1995, Seattle, Washington, USA, April 30, 1995