Yida Liang
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Bibliography
2026
Mitigating Conductance Drift via In-Situ Calibration for Reliable RRAM-Based CIM Edge Inference.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2026
A 40-nm Resilient MLC RRAM Macro with Self-Referenced Time-Based Readout and 3-Bit Interleaved ECC Achieving 0.22 pJ/bit Read Energy.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2026