YongJoon Kim

According to our database1, YongJoon Kim authored at least 15 papers between 2003 and 2016.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.



In proceedings 
PhD thesis 


On csauthors.net:


Temperature and voltage droop-aware test scheduling during scan shift operation.
IEICE Electron. Express, 2016

Selective Scan Slice Grouping Technique for Efficient Test Data Compression.
IEICE Trans. Inf. Syst., 2010

A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption.
IEICE Trans. Inf. Syst., 2010

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time.
IEICE Trans. Inf. Syst., 2009

Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume.
IEICE Electron. Express, 2009

A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009

An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.
J. Electron. Test., 2008

An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme.
Proceedings of the 17th IEEE Asian Test Symposium, 2008

XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults.
Proceedings of the 17th IEEE Asian Test Symposium, 2008

MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.
J. Electron. Test., 2007

MICRO: a new hybrid test data compression/decompression scheme.
IEEE Trans. Very Large Scale Integr. Syst., 2006

A new maximal diagnosis algorithm for interconnect test.
IEEE Trans. Very Large Scale Integr. Syst., 2004

Test-decompression mechanism using a variable-length multiple-polynomial LFSR.
IEEE Trans. Very Large Scale Integr. Syst., 2003

A New Maximal Diagnosis Algorithm for Bus-structured Systems.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003