YongJoon Kim

According to our database, YongJoon Kim authored at least 17 papers between 2003 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Temperature and voltage droop-aware test scheduling during scan shift operation.

Taehee Lee, YongJoon Kim, Joon-Sung Yang

IEICE Electron. Express, 2016

2010

Selective Scan Slice Grouping Technique for Efficient Test Data Compression.

YongJoon Kim, Jaeseok Park, Sungho Kang

IEICE Trans. Inf. Syst., 2010

A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption.

YongJoon Kim, Jaeseok Park, Sungho Kang

IEICE Trans. Inf. Syst., 2010

2009

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time.

YongJoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park, Sungho Kang

IEICE Trans. Inf. Syst., 2009

Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume.

YongJoon Kim, Jaeseok Park, Sungho Kang

IEICE Electron. Express, 2009

A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections.

Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008

An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.

Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang

J. Electron. Test., 2008

An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.

Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme.

Taejin Kim, Sunghoon Chun, YongJoon Kim, Myung-Hoon Yang, Sungho Kang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults.

Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.

Sunghoon Chun, YongJoon Kim, Sungho Kang

J. Electron. Test., 2007

High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects.

Sunghoon Chun, YongJoon Kim, Sungho Kang

Proceedings of the 16th Asian Test Symposium, 2007

2006

MICRO: a new hybrid test data compression/decompression scheme.

Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang

IEEE Trans. Very Large Scale Integr. Syst., 2006

An Effective Test Pattern Generation for Testing Signal Integrity.

YongJoon Kim, Myung-Hoon Yang, Youngkyu Park, Daeyeal Lee, Sungho Kang

Proceedings of the 15th Asian Test Symposium, 2006

2004

A new maximal diagnosis algorithm for interconnect test.

YongJoon Kim, Hyun-Don Kim, Sungho Kang

IEEE Trans. Very Large Scale Integr. Syst., 2004

2003

Test-decompression mechanism using a variable-length multiple-polynomial LFSR.

Hong-Sik Kim, YongJoon Kim, Sungho Kang

IEEE Trans. Very Large Scale Integr. Syst., 2003

A New Maximal Diagnosis Algorithm for Bus-structured Systems.

YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003