Daeyeal Lee

Orcid: 0000-0003-0778-0110

According to our database1, Daeyeal Lee authored at least 14 papers between 2006 and 2022.

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Bibliography

2022
Machine Learning Prediction for Design and System Technology Co-Optimization Sensitivity Analysis.
IEEE Trans. Very Large Scale Integr. Syst., 2022

PROBE2.0: A Systematic Framework for Routability Assessment From Technology to Design in Advanced Nodes.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

SMT-Based Contention-Free Task Mapping and Scheduling on 2D/3D SMART NoC with Mixed Dimension-Order Routing.
ACM Trans. Archit. Code Optim., 2022

Monolithic 3D Semiconductor Footprint Scaling Exploration Based on VFET Standard Cell Layout Methodology, Design Flow, and EDA Platform.
IEEE Access, 2022

2021
Complementary-FET (CFET) Standard Cell Synthesis Framework for Design and System Technology Co-Optimization Using SMT.
IEEE Trans. Very Large Scale Integr. Syst., 2021

SP&R: SMT-Based Simultaneous Place-and-Route for Standard Cell Synthesis of Advanced Nodes.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

SMT-Based Contention-Free Task Mapping and Scheduling on SMART NoC.
IEEE Embed. Syst. Lett., 2021

CoRe-ECO: Concurrent Refinement of Detailed Place-and-Route for an Efficient ECO Automation.
Proceedings of the 39th IEEE International Conference on Computer Design, 2021

2020
Grid-Based Framework for Routability Analysis and Diagnosis With Conditional Design Rules.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Standard-Cell Scaling Framework with Guaranteed Pin-Accessibility.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

A Routability-Driven Complimentary-FET (CFET) Standard Cell Synthesis Framework using SMT.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020

SP&R: Simultaneous Placement and Routing framework for standard cell synthesis in sub-7nm.
Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2012

2006
An Effective Test Pattern Generation for Testing Signal Integrity.
Proceedings of the 15th Asian Test Symposium, 2006


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