Sunghoon Chun

According to our database1, Sunghoon Chun authored at least 14 papers between 2003 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2010
DiSC: A New Diagnosis Method for Multiple Scan Chain Failures.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

2009
ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.
J. Electron. Test., 2008

An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method.
Proceedings of the 2008 IEEE International Test Conference, 2008

An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme.
Proceedings of the 17th IEEE Asian Test Symposium, 2008

XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults.
Proceedings of the 17th IEEE Asian Test Symposium, 2008

A new low energy BIST using a statistical code.
Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008

2007
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.
J. Electron. Test., 2007

2006
MICRO: a new hybrid test data compression/decompression scheme.
IEEE Trans. Very Large Scale Integr. Syst., 2006

An Efficient Dictionary Organization for Maximum Diagnosis.
J. Electron. Test., 2006

2004
RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test.
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003
A New Maximal Diagnosis Algorithm for Bus-structured Systems.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003


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