Yoong Seang Jonathan Ong

According to our database, Yoong Seang Jonathan Ong authored at least 11 papers between 2018 and 2021.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2021

Utilizing a Telegram Quiz Bot to Promote Retrieval Practice.

Prasanth Rajan Mohan, Jonathan Ong, Fun Man Fung, Jia Yi Han, Jia Ying Chew

Proceedings of the 2021 IEEE International Conference on Engineering, 2021

2019

A System for Standard Cell Routability Checking and Placement Routability Improvements.

I-Lun Tseng, Zhao Chuan Lee, Vikas Tripathi, Chun Ming Tommy Yip, Zhinan Chen, Jonathan Ong

Proceedings of the 2019 IEEE Asia Pacific Conference on Circuits and Systems, 2019

2018

Context-Aware DFM Rule Analysis and Scoring Using Machine Learning.

Vikas Tripathi, Valerio Perez, Yongfu Li, Zhao Chuan Lee, I-Lun Tseng, Jonathan Ong

CoRR, 2018

Creation and Fixing of Lithography Hotspots with Synopsys Tools.

I-Lun Tseng, Valerio Perez, Yongfu Li, Zhao Chuan Lee, Vikas Tripathi, Yoong Seang Jonathan Ong

CoRR, 2018

Standard Cell Library Evaluation with Multiple lithography-compliant verification and Improved Synopsys Pin Access Checking Utility.

Yongfu Li, Wan Chia Ang, Chin Hui Lee, Kok Peng Chua, Yoong Seang Jonathan Ong, Chiu Wing Colin Hui

CoRR, 2018

Multiple-Lithography-Compliant Verification for Standard Cell Library Development Flow.

Yongfu Li, Wan Chia Ang, Chin Hui Lee, Kok Peng Chua, Yoong Seang Jonathan Ong, Chiu Wing Colin Hui

CoRR, 2018

Advanced In-Design Auto-Fixing Flow for Cell Abutment Pattern Matching Weakpoints.

Yongfu Li, Valerio Perez, I-Lun Tseng, Zhao Chuan Lee, Vikas Tripathi, Jason Khaw, Yoong Seang Jonathan Ong

CoRR, 2018

In Design DFM Rule Scoring and Fixing Method using ICV.

Vikas Tripathi, Yongfu Li, Zhao Chuan Lee, I-Lun Tseng, Jason Khaw, Jonathan Ong

CoRR, 2018

Constraining the Synopsys Pin Access Checker Utility for Improved Standard Cells Library Verification Flow.

Yongfu Li, Chin Hui Lee, Wan Chia Ang, Kok Peng Chua, Yoong Seang Jonathan Ong, Chiu Wing Colin Hui

CoRR, 2018

Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching.

Yongfu Li, I-Lun Tseng, Zhao Chuan Lee, Valerio Perez, Vikas Tripathi, Yoong Seang Jonathan Ong

Proceedings of the 2018 IEEE Computer Society Annual Symposium on VLSI, 2018

An Automated System for Checking Lithography Friendliness of Standard Cells.

I-Lun Tseng, Yongfu Li, Valerio Perez, Vikas Tripathi, Zhao Chuan Lee, Yoong Seang Jonathan Ong

Proceedings of the 2018 IEEE Asia Pacific Conference on Circuits and Systems, 2018