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Zhao Chuan Lee

According to our database¹, Zhao Chuan Lee authored at least 18 papers between 2012 and 2021.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

Legend:

Book

In proceedings

Article

PhD thesis

Dataset

Other

Links

On csauthors.net:

Bibliography

2021

A 16-kb 9T Ultralow-Voltage SRAM With Column-Based Split Cell-VSS, Data-Aware Write-Assist, and Enhanced Read Sensing Margin in 28-nm FDSOI.

[BibT_eX]

[DOI]

M. Sultan M. Siddiqui

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Tony Tae-Hyoung Kim

IEEE Trans. Very Large Scale Integr. Syst., 2021

2019

Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation.

[BibT_eX]

[DOI]

Achiranshu Garg

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Tony Tae-Hyoung Kim

Microelectron. J., 2019

An 8T SRAM With On-Chip Dynamic Reliability Management and Two-Phase Write Operation in 28-nm FDSOI.

[BibT_eX]

[DOI]

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M. Sultan M. Siddiqui

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Tony Tae-Hyoung Kim

IEEE J. Solid State Circuits, 2019

A System for Standard Cell Routability Checking and Placement Routability Improvements.

[BibT_eX]

[DOI]

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Chun Ming Tommy Yip

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Proceedings of the 2019 IEEE Asia Pacific Conference on Circuits and Systems, 2019

2018

Context-Aware DFM Rule Analysis and Scoring Using Machine Learning.

[BibT_eX]

[DOI]

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CoRR, 2018

Creation and Fixing of Lithography Hotspots with Synopsys Tools.

[BibT_eX]

[DOI]

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Yoong Seang Jonathan Ong

CoRR, 2018

Advanced In-Design Auto-Fixing Flow for Cell Abutment Pattern Matching Weakpoints.

[BibT_eX]

[DOI]

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Yoong Seang Jonathan Ong

CoRR, 2018

In Design DFM Rule Scoring and Fixing Method using ICV.

[BibT_eX]

[DOI]

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CoRR, 2018

Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching.

[BibT_eX]

[DOI]

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Yoong Seang Jonathan Ong

Proceedings of the 2018 IEEE Computer Society Annual Symposium on VLSI, 2018

An Automated System for Checking Lithography Friendliness of Standard Cells.

[BibT_eX]

[DOI]

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Yoong Seang Jonathan Ong

Proceedings of the 2018 IEEE Asia Pacific Conference on Circuits and Systems, 2018

2017

A 16kb column-based split cell-VSS, data-aware write-assisted 9T ultra-low voltage SRAM with enhanced read sensing margin in 28nm FDSOI.

[BibT_eX]

[DOI]

M. Sultan M. Siddiqui

,

,

Tony Tae-Hyoung Kim

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2017

2016

0.2 V 8T SRAM With PVT-Aware Bitline Sensing and Column-Based Data Randomization.

[BibT_eX]

[DOI]

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Tony Tae-Hyoung Kim

IEEE J. Solid State Circuits, 2016

An 8T SRAM with BTI-Aware Stability Monitor and two-phase write operation for cell stability improvement in 28-nm FDSOI.

[BibT_eX]

[DOI]

,

M. Sultan M. Siddiqui

,

,

Tony Tae-Hyoung Kim

Proceedings of the ESSCIRC Conference 2016: 42<sup>nd</sup> European Solid-State Circuits Conference, 2016

2014

0.77 fJ/bit/search Content Addressable Memory Using Small Match Line Swing and Automated Background Checking Scheme for Variation Tolerance.

[BibT_eX]

[DOI]

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Kavitha Velayudhan

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Tony Tae-Hyoung Kim

IEEE J. Solid State Circuits, 2014

0.2 V 8T SRAM with improved bitline sensing using column-based data randomization.

[BibT_eX]

[DOI]

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,

,

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Tony Tae-Hyoung Kim

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2014

2013

NBTI/PBTI-Aware WWL Voltage Control for Half-Selected Cell Stability Improvement.

[BibT_eX]

[DOI]

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Tony Tae-Hyoung Kim

IEEE Trans. Circuits Syst. II Express Briefs, 2013

2012

NBTI/PBTI-aware wordline voltage control with no boosted supply for stability improvement of half-selected SRAM cells.

[BibT_eX]

[DOI]

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Proceedings of the International SoC Design Conference, 2012

A novel analog-to-residue converter for biomedical DSP application.

[BibT_eX]

[DOI]

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Proceedings of the International SoC Design Conference, 2012

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