Yoshio Takazawa

According to our database, Yoshio Takazawa authored at least 6 papers between 2012 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM.

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani, Kazutoshi Kobayashi

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2021

2019

Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 nm Fin-FET Process.

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET.

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii

Proceedings of the IEEE International Reliability Physics Symposium, 2018

A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process.

Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2018

2017

NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator.

Mitsuhiko Igarashi, Yoshio Takazawa, Yasumasa Tsukamoto, Kan Takeuchi, Koji Shibutani

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2017

2012

28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization.

Mitsuhiko Igarashi, Kan Takeuchi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012