Youngki Moon

Orcid: 0009-0001-4264-4803

According to our database¹, Youngki Moon authored at least 10 papers between 2021 and 2026.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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Book In proceedings Article PhD thesis Dataset Other

Links

On csauthors.net:

Bibliography

2026

Evolution of Obfuscation-Based Scan Design Techniques.

[BibT_eX]

[DOI]

ACM Comput. Surv., August, 2026

A Low Area Built-In Self-Repair Using Hybrid Fault Address Memory for HBM.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., March, 2026

STAR-PIM: Self-Test and Repair Structure for Processing-in-Memory With Adder Tree-Based MAC.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., March, 2026

FADE: Fault-Aware Adaptive On-Die ECC for Improving Robustness.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., February, 2026

2025

A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2025

A Novel Prediction-Based Two-Tiered ECC for Mitigating SWD Errors in HBM.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., February, 2025

PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse Engineering Attacks.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., January, 2025

2024

Effective Data-Width Aware ECC Scheme for HBM.

[BibT_eX]

[DOI]

Proceedings of the 21st International SoC Design Conference, 2024

2022

Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis.

[BibT_eX]

[DOI]

Proceedings of the 19th International SoC Design Conference, 2022

2021

Area Efficient Built-In Redundancy Analysis using Pre-Solutions with Various Spare Structure.

[BibT_eX]

[DOI]

Proceedings of the 18th International SoC Design Conference, 2021

Youngki Moon

Timeline

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Links

On csauthors.net:

Bibliography

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