Seokjun Jang

According to our database, Seokjun Jang authored at least 10 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Shift Left Quality Management System (QMS) Using a 3-D Matrix Scanning Method on System on a Chip.

Yong Lee, Seokjun Jang, Sungho Kang

IEEE Trans. Circuits Syst. II Express Briefs, April, 2023

Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis.

Sunghoon Kim, Seokjun Jang, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023

LOTS: Low Overhead TSV Repair Method Using IEEE-1838 Standard Architecture.

Sunghoon Kim, Donghyun Han, Seokjun Jang, Sungho Kang

Proceedings of the 20th International SoC Design Conference, 2023

2022

Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis.

Sunghoon Kim, Seokjun Jang, Youngki Moon, Sungho Kang

Proceedings of the 19th International SoC Design Conference, 2022

2021

A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key.

Hyungil Woo, Seokjun Jang, Sungho Kang

IEEE Access, 2021

Reconfigurable Scan Architecture for High Diagnostic Resolution.

Seokjun Jang, Jihye Kim, Sungho Kang

IEEE Access, 2021

Secure Scan Design through Pseudo Fault Injection.

Seokjun Jang, Hyungil Woo, Sunghoon Kim, Sungho Kang

Proceedings of the 18th International SoC Design Conference, 2021

2020

Fine-Grained Defect Diagnosis for CMOL FPGA Circuits.

Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang

IEEE Access, 2020

Memory-like Defect Diagnosis for CMOL FPGAs.

Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang

Proceedings of the International SoC Design Conference, 2020

2018

A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain.

Hyeonchan Lim, Seokjun Jang, Sungho Kang

Proceedings of the International SoC Design Conference, 2018