Yuan-Shih Chen

According to our database, Yuan-Shih Chen authored at least 5 papers between 2006 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Case study of scan chain diagnosis and PFA on a low yield wafer.

Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Yield Ramp up by Scan Chain Diagnosis.

Feng-Ming Kuo, Yuan-Shih Chen

Proceedings of the Eighteentgh Asian Test Symposium, 2009

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns.

Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2007

Diagnose compound scan chain and system logic defects.

Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

Diagnosis with Limited Failure Information.

Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen

Proceedings of the 2006 IEEE International Test Conference, 2006