Nagesh Tamarapalli

According to our database, Nagesh Tamarapalli authored at least 22 papers between 1996 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Tutorial T5: High Performance Low Power Designs - Challenges and Best practices in Design, Verification and Test.

Nagesh Tamarapalli, Prashanth Vallur, Sachin Kulkarni

Proceedings of the 28th International Conference on VLSI Design, 2015

2014

Application of Test-View Modeling to Hierarchical ATPG.

Rahul Shukla, Phong Loi, Ken Pham, Arie Margulis, Kathy Yang, Nagesh Tamarapalli

Proceedings of the 2014 27th International Conference on VLSI Design, 2014

2013

Tutorial T10: Post - Silicon Validation, Debug and Diagnosis.

Prabhat Mishra, Masahiro Fujita, Virendra Singh, Nagesh Tamarapalli, Sharad Kumar, Rajesh Mittal

Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013

2012

Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.

Srikanth Venkataraman, Nagesh Tamarapalli

Proceedings of the 25th International Conference on VLSI Design, 2012

2008

DFM / DFT / SiliconDebug / Diagnosis.

Srikanth Venkataraman, Nagesh Tamarapalli

Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

2006

DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.

David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman

Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006

Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis.

Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich

Proceedings of the 2006 IEEE International Test Conference, 2006

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis.

Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware

Proceedings of the 2006 IEEE International Test Conference, 2006

Diagnosis with Limited Failure Information.

Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen

Proceedings of the 2006 IEEE International Test Conference, 2006

The Next Step in Volume Scan Diagnosis: Standard Fail Data Format.

Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang

Proceedings of the 15th Asian Test Symposium, 2006

2005

Achieving higher yield through diagnosis.

Nagesh Tamarapalli

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Compression mode diagnosis enables high volume monitoring diagnosis flow.

Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Compactor Independent Direct Diagnosis.

Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003

Embedded Deterministic Test for Low-Cost Manufacturing.

Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian

IEEE Des. Test Comput., 2003

High-Frequency, At-Speed Scan Testing.

Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli

IEEE Des. Test Comput., 2003

Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions.

Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Impact of Multiple-Detect Test Patterns on Product Quality.

Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Embedded Deterministic Test for Low-Cost Manufacturing Test.

Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000

Automated synthesis of phase shifters for built-in self-testapplications.

Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

1999

Logic BIST for large industrial designs: real issues and case studies.

Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Automated synthesis of large phase shifters for built-in self-test.

Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1996

Constructive Multi-Phase Test Point Insertion for Scan-Based BIST.

Nagesh Tamarapalli, Janusz Rajski

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996