Yun Ye

Orcid: 0000-0002-1905-4354

Affiliations:
  • Intel Corporation, Beijing, China


According to our database1, Yun Ye authored at least 16 papers between 2008 and 2025.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

Online presence:

On csauthors.net:

Bibliography

2025
RealHD: A High-Quality Dataset for Robust Detection of State-of-the-Art AI-Generated Images.
Proceedings of the 33rd ACM International Conference on Multimedia, 2025

2023
DanceU: motion-and-music-based automatic effect generation for dance videos.
Proceedings of the IEEE International Conference on Multimedia and Expo, 2023

Frequency-Aware Re-Parameterization for Over-Fitting Based Image Compression.
Proceedings of the IEEE International Conference on Image Processing, 2023

2020
MFPP: Morphological Fragmental Perturbation Pyramid for Black-Box Model Explanations.
Proceedings of the 25th International Conference on Pattern Recognition, 2020

Channel Pruning via Optimal Thresholding.
Proceedings of the Neural Information Processing - 27th International Conference, 2020

PipeNet: Selective Modal Pipeline of Fusion Network for Multi-Modal Face Anti-Spoofing.
Proceedings of the 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2020

2019
Outfit Compatibility Prediction and Diagnosis with Multi-Layered Comparison Network.
CoRR, 2019

Hard-Aware Fashion Attribute Classification.
CoRR, 2019

Spatial-Aware Non-Local Attention for Fashion Landmark Detection.
Proceedings of the IEEE International Conference on Multimedia and Expo, 2019

Human Mesh Recovery From Monocular Images via a Skeleton-Disentangled Representation.
Proceedings of the 2019 IEEE/CVF International Conference on Computer Vision, 2019

2018
Spot the Difference by Object Detection.
CoRR, 2018

2012
The potential of Fe-FET for robust design under variations: A compact modeling study.
Microelectron. J., 2012

2011
Statistical Modeling and Simulation of Threshold Variation Under Random Dopant Fluctuations and Line-Edge Roughness.
IEEE Trans. Very Large Scale Integr. Syst., 2011

2010
Simulation of random telegraph Noise with 2-stage equivalent circuit.
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

2009
Variability analysis under layout pattern-dependent rapid-thermal annealing process.
Proceedings of the 46th Design Automation Conference, 2009

2008
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness.
Proceedings of the 45th Design Automation Conference, 2008


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