Zhenghao Gan

According to our database, Zhenghao Gan authored at least 10 papers between 2005 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

SageSched: Efficient LLM Scheduling Confronting Demand Uncertainty and Hybridity.

Zhenghao Gan, Yichen Bao, Yifei Liu, Chen Chen, Quan Chen, Minyi Guo

CoRR, March, 2026

2025

Efficient Serving of LLM Applications with Probabilistic Demand Modeling.

Yifei Liu, Zuo Gan, Zhenghao Gan, Weiye Wang, Chen Chen, Yizhou Shan, Xusheng Chen, Zhenhua Han, Yifei Zhu, Shixuan Sun, Minyi Guo

CoRR, June, 2025

2024

Face2QR: A Unified Framework for Aesthetic, Face-Preserving, and Scannable QR Code Generation.

Xuehao Cui, Guangyang Wu, Zhenghao Gan, Guangtao Zhai, Xiaohong Liu

Proceedings of the Advances in Neural Information Processing Systems 37: Annual Conference on Neural Information Processing Systems 2024, 2024

2023

Multi-view 3D Face Reconstruction Based on Flame.

Wenzhuo Zheng, Junhao Zhao, Xiaohong Liu, Yongyang Pan, Zhenghao Gan, Haozhe Han, Ning Liu

CoRR, 2023

FLAME-Based Multi-view 3D Face Reconstruction.

Wenzhuo Zheng, Junhao Zhao, Xiaohong Liu, Yongyang Pan, Zhenghao Gan, Haozhe Han, Ning Liu

Proceedings of the Advances in Computer Graphics, 2023

2018

New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.

Pengpeng Ren, Changze Liu, Sanping Wan, Jiayang Zhang, Zhuoqing Yu, Nie Liu, Yongsheng Sun, Runsheng Wang, Canhui Zhan, Zhenghao Gan, Waisum Wong, Yu Xia, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2014

New insight on negative bias temperature instability degradation with drain bias of 28 nm High-K Metal Gate p-MOSFET devices.

Miao Liao, Zhenghao Gan

Microelectron. Reliab., 2014

2012

Applications of finite element methods for reliability study of ULSI interconnections.

Cher Ming Tan, Wei Li, Zhenghao Gan

Microelectron. Reliab., 2012

2006

Feasibility study of the application of voltage contrast to printed circuit board.

Cher Ming Tan, Zhenghao Gan, Tai Chong Chai

Microelectron. Reliab., 2006

2005

Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications.

Cher Ming Tan, Zhenghao Gan, Wai Fung Ho, Sam Chen, Robert Liu

Microelectron. Reliab., 2005