Alan W. Righter

According to our database, Alan W. Righter authored at least 8 papers between 1993 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Investigation on effectiveness of series gate resistor in CDM ESD protection designs.

Yuanzhong (Paul) Zhou, Alan W. Righter, Jean-Jacques Hajjar

Proceedings of the IEEE 10th International Conference on ASIC, 2013

2005

Real-world printed circuit board ESD failures.

Andrew Olney, Brad Gifford, John Guravage, Alan W. Righter

Microelectron. Reliab., 2005

1998

CMOS IC reliability indicators and burn-in economics.

Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

i_DD Pulse Response Testing Applied to Complex CMOS ICs.

J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

High Resolution I_DDQ Characterization and Testing - Practical Issues.

Alan W. Righter, Jerry M. Soden, Richard W. Beegle

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Solving Known Good Die (and Substrate) Test Issues.

Alan W. Righter

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Defect Classes - An Overdue Paradigm for CMOS IC.

Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

A General Purpose I_DDQ Measurement Circuit.

Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993