Alexandre Ney

According to our database, Alexandre Ney authored at least 9 papers between 2007 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Analysis of Resistive-Open Defects in SRAM Sense Amplifiers.

Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian

IEEE Trans. Very Large Scale Integr. Syst., 2009

A new design-for-test technique for SRAM core-cell stability faults.

Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin

Proceedings of the Design, Automation and Test in Europe, 2009

2008

An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing.

Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs.

Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian

Proceedings of the 2008 IEEE International Test Conference, 2008

A Design-for-Diagnosis Technique for SRAM Write Drivers.

Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin

Proceedings of the Design, Automation and Test in Europe, 2008

2007

Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.

Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.

Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian

Proceedings of the 12th European Test Symposium, 2007

Slow write driver faults in 65nm SRAM technology: analysis and March test solution.

Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior.

Magali Bastian, Vincent Gouin, Patrick Girard, Christian Landrault, Alexandre Ney, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 16th Asian Test Symposium, 2007