Anand T. Krishnan

According to our database, Anand T. Krishnan authored at least 3 papers between 2004 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2007

An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology.

Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2005

Impact of negative bias temperature instability on digital circuit reliability.

Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan

Microelectron. Reliab., 2005

2004

Impact of Negative Bias Temperature Instability on Product Parametric Drift.

Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004