Andre Juge

According to our database, Andre Juge authored at least 8 papers between 2005 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs.

Denis Rideau, Wilfried Uhring, R. A. Bianchi, Rémi Helleboid, Gabriel Mugny, Jérémy Grebot, Jean-Robert Manouvrier, R. Neri, F. Brun, Mohammadreza Dolatpoor Lakeh, Sven Rink, Jean-Baptiste Kammerer, Christophe Lallement, E. Lacombe, Dominique Golanski, Bruce Rae, T. M. Bah, F. Twaddle, V. Quenette, G. Marchand, Christel Buj, R. Fillon, Y. Henrion, Isobel Nicholson, Megan Agnew, M. Basset, R. Perrier, M. Al-Rawhani, Bastien Mamdy, S. Pellegrin, Gilles Gouget, P. Maciazek, Andre Juge, A. Dartigues, Hélène Wehbe-Alause

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2022

A self-sustaining Single Photon Avalanche Diode Model.

Sven Rink, V. Quenette, Jean-Robert Manouvrier, Andre Juge, Gilles Gouget, Denis Rideau, R. A. Bianchi, Dominique Golanski, Bastien Mamdy, Jean-Baptiste Kammerer, Wilfried Uhring, Christophe Lallement, Sara Pellegrini, Megan Agnew, Bruce Rae

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2018

Analog RF and mm-Wave design Tradeoff in UTBB FDSOI: Application to a 35 GHz LNA.

Salim El Ghouli, Wladyslaw Grabinski, Jean-Michel Sallese, Andre Juge, Christophe Lallement

Proceedings of the 25th International Conference "Mixed Design of Integrated Circuits and System", 2018

Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs.

Krishna Pradeep, Theano A. Karatsori, Thierry Poiroux, Andre Juge, Patrick Scheer, Gilles Gouget, Emmanuel Josse, Gérard Ghibaudo

Proceedings of the 48th European Solid-State Device Research Conference, 2018

2016

Analog and RF modeling of FDSOI UTBB MOSFET using Leti-UTSOI model.

Salim El Ghouli, Patrick Scheer, Michel Minondo, Andre Juge, Thierry Poiroux, Jean-Michel Sallese, Christophe Lallement

Proceedings of the 2016 MIXDES, 2016

2014

Characterization Methodology for MOSFET Local Systematic Variability in Presence of Statistical Variability.

Omar Jonani Franco Piliado, Giancarlo Castaneda, Andre Juge, Gérard Ghibaudo

J. Low Power Electron., 2014

2012

Statistical Estimation of Dominant Physical Parameters for Leakage Variability in 32 Nanometer CMOS, Under Supply Voltage Variations.

Smriti Joshi, Anne Lombardot, Philippe Flatresse, Carmelo D'Agostino, Andre Juge, Edith Beigné, Stéphane Girard

J. Low Power Electron., 2012

2005

Characterization and Modeling of Gate-Induced-Drain-Leakage.

Fabien Gilibert, Denis Rideau, Alexandre Dray, Francois Agut, Michel Minondo, Andre Juge, Pascal Masson, Rachid Bouchakour

IEICE Trans. Electron., 2005