Pascal Masson

According to our database1, Pascal Masson authored at least 14 papers between 2004 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
40nm SONOS Embedded Select in Trench Memory.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2022
A Schmitt trigger to benchmark the performance of a new zero-cost transistor.
Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

2018
Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015
Dynamic current reduction of CMOS digital circuits through design and process optimization.
Proceedings of the 25th International Workshop on Power and Timing Modeling, 2015

Layout optimizations to decrease internal power and area in digital CMOS standard cells.
Proceedings of the 38th International Convention on Information and Communication Technology, 2015

2014
Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Effect of AC stress on oxide TDDB and trapped charge in interface states.
Proceedings of the 2014 International Symposium on Integrated Circuits (ISIC), 2014

2013
Effect of ions presence in the SiOCH inter metal dielectric structure.
Proceedings of the European Solid-State Device Research Conference, 2013

2012
Effects of 1064 nm laser on MOS capacitor.
Microelectron. Reliab., 2012

Investigation of the effects of constant voltage stress on thin SiO<sub>2</sub> layers using dynamic measurement protocols.
Microelectron. Reliab., 2012

Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability.
J. Low Power Electron., 2012

2006
MM11 based flash memory cell model including characterization procedure.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2005
Characterization and Modeling of Gate-Induced-Drain-Leakage.
IEICE Trans. Electron., 2005

2004
A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology.
Proceedings of the 2004 Design, 2004


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