André K. Nieuwland

According to our database1, André K. Nieuwland authored at least 14 papers between 2003 and 2008.

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Bibliography

2008
Power Consumption of Fault Tolerant Busses.
IEEE Trans. Very Large Scale Integr. Syst., 2008

Simultaneous Switching Noise: The Relation between Bus Layout and Coding.
IEEE Des. Test Comput., 2008

2006
Combinational Logic Soft Error Analysis and Protection.
Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005
New ECC for Crosstalk Impact Minimization.
IEEE Des. Test Comput., 2005

Exploiting ECC Redundancy to Minimize Crosstalk Impact.
IEEE Des. Test Comput., 2005

Coding Techniques for Low Switching Noise in Fault Tolerant Busses.
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

On-Line Testing for Secure Implementations: Design and Validation.
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004
IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors.
J. Electron. Test., 2004

Reducing Cross-Talk Induced Power Consumption and Delay.
Proceedings of the Integrated Circuit and System Design, 2004

Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems.
Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

Automated Logic SER Analysis and On-Line SER reduction.
Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

Why Transition Coding for Power Minimization of On-Chip Buses Does Not Work.
Proceedings of the 2004 Design, 2004

2003
Power Consumption of Fault Tolerant Codes: the Active Elements.
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

The positive effect on IC yield of embedded Fault Tolerance for SEUs.
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003


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