André K. Nieuwland

According to our database, André K. Nieuwland authored at least 14 papers between 2003 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2008

Power Consumption of Fault Tolerant Busses.

Daniele Rossi, André K. Nieuwland, Steven V. E. S. van Dijk, Richard P. Kleihorst, Cecilia Metra

IEEE Trans. Very Large Scale Integr. Syst., 2008

Simultaneous Switching Noise: The Relation between Bus Layout and Coding.

Daniele Rossi, André K. Nieuwland, Cecilia Metra

IEEE Des. Test Comput., 2008

2006

Combinational Logic Soft Error Analysis and Protection.

André K. Nieuwland, Samir Jasarevic, Goran Jerin

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005

New ECC for Crosstalk Impact Minimization.

Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra

IEEE Des. Test Comput., 2005

Exploiting ECC Redundancy to Minimize Crosstalk Impact.

Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra

IEEE Des. Test Comput., 2005

Coding Techniques for Low Switching Noise in Fault Tolerant Busses.

André K. Nieuwland, Atul Katoch, Daniele Rossi, Cecilia Metra

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

On-Line Testing for Secure Implementations: Design and Validation.

Régis Leveugle, Yervant Zorian, Luca Breveglieri, André K. Nieuwland, Klaus Rothbart, Jean-Pierre Seifert

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004

IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors.

André K. Nieuwland, Richard P. Kleihorst

J. Electron. Test., 2004

Reducing Cross-Talk Induced Power Consumption and Delay.

André K. Nieuwland, Atul Katoch, Maurice Meijer

Proceedings of the Integrated Circuit and System Design, 2004

Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems.

Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

Automated Logic SER Analysis and On-Line SER reduction.

André K. Nieuwland, Patrick Gindner

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

Why Transition Coding for Power Minimization of On-Chip Buses Does Not Work.

Claudia Kretzschmar, André K. Nieuwland, Dietmar Müller

Proceedings of the 2004 Design, 2004

2003

Power Consumption of Fault Tolerant Codes: the Active Elements.

Daniele Rossi, Steven V. E. S. van Dijk, Richard P. Kleihorst, André K. Nieuwland, Cecilia Metra

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

The positive effect on IC yield of embedded Fault Tolerance for SEUs.

André K. Nieuwland, Richard P. Kleihorst

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003