Andreas Martin
Affiliations:- Infineon Technologies AG, Corporate reliability department, Neubiberg, Germany
According to our database1,
Andreas Martin
authored at least 11 papers
between 2001 and 2022.
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Bibliography
2022
Plasma processing induced charging damage (PID) assessment with appropriate fWLR stress methods ensuring expected MOS reliability and lifetimes for automotive products (Invited).
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2020
A New Implementation Approach for Reliability Design Rules against Plasma Induced Charging Damage from Well Configurations of Complex ICs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Microelectron. Reliab., 2018
2016
Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process.
Microelectron. Reliab., 2016
Plasma process induced damage detection by fast wafer level reliability monitoring for automotive applications.
Microelectron. Reliab., 2016
2005
Microelectron. Reliab., 2005
2004
An introduction to fast wafer level reliability monitoring for integrated circuit mass production.
Microelectron. Reliab., 2004
2003
Ramped current stress for fast and reliable wafer level reliability monitoring of thin gate oxide reliability.
Microelectron. Reliab., 2003
2001
Microelectron. Reliab., 2001