Artur Ghukasyan

According to our database, Artur Ghukasyan authored at least 2 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Testing for Electromigration in Sub-5-nm FinFET Memories.

Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian

IEEE Des. Test, December, 2024

2023

Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era.

Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the 41st IEEE VLSI Test Symposium, 2023