Mahta Mayahinia

According to our database, Mahta Mayahinia authored at least 21 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Design-time Reference Current Generation for Robust Spintronic-based Neuromorphic Architecture.

Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

ACM J. Emerg. Technol. Comput. Syst., January, 2024

2023

Timing-accurate simulation framework for NVM-based compute-in-memory architecture exploration.

Vincent Rietz, Christopher Münch, Mahta Mayahinia, Mehdi Baradaran Tahoori

it Inf. Technol., May, 2023

A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications.

Surendra Hemaram, Soyed Tuhin Ahmed, Mahta Mayahinia, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Emerging Interconnect Exploration for SRAM Application Using Nonconventional H-Tree and Center-Pin Access.

Zhenlin Pei, Mahta Mayahinia, Hsiao-Hsuan Liu, Mehdi B. Tahoori, Shairfe Muhammad Salahuddin, Francky Catthoor, Zsolt Tokei, Chenyun Pan

Proceedings of the 24th International Symposium on Quality Electronic Design, 2023

Technology/Memory Co-Design and Co-Optimization Using E-Tree Interconnect.

Zhenlin Pei, Mahta Mayahinia, Hsiao-Hsuan Liu, Mehdi B. Tahoori, Francky Catthoor, Zsolt Tokei, Chenyun Pan

Proceedings of the Great Lakes Symposium on VLSI 2023, 2023

Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies.

Brojogopal Sapui, Jonas Krautter, Mahta Mayahinia, Atousa Jafari, Dennis Gnad, Sergej Meschkov, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2023

On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI.

Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE European Test Symposium, 2023

Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes.

Mahta Mayahinia, Hsiao-Hsuan Liu, Subrat Mishra, Zsolt Tokei, Francky Catthoor, Mehdi B. Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Special Session - Non-Volatile Memories: Challenges and Opportunities for Embedded System Architectures with Focus on Machine Learning Applications.

Jörg Henkel, Lokesh Siddhu, Lars Bauer, Jürgen Teich, Stefan Wildermann, Mehdi B. Tahoori, Mahta Mayahinia, Jerónimo Castrillón, Asif Ali Khan, Hamid Farzaneh, João Paulo C. de Lima, Jian-Jia Chen, Christian Hakert, Kuan-Hsun Chen, Chia-Lin Yang, Hsiang-Yun Cheng

Proceedings of the International Conference on Compilers, 2023

2022

Time-Dependent Electromigration Modeling for Workload-Aware Design-Space Exploration in STT-MRAM.

Mahta Mayahinia, Mehdi B. Tahoori, Manu Perumkunnil Komalan, Houman Zahedmanesh, Kristof Croes, Tommaso Marinelli, José Ignacio Gómez Pérez, Timon Evenblij, Gouri Sankar Kar, Francky Catthoor

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

A Voltage-Controlled, Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs.

Mahta Mayahinia, Abhairaj Singh, Christopher Bengel, Stefan Wiefels, Muath Abu Lebdeh, Stephan Menzel, Dirk J. Wouters, Anteneh Gebregiorgis, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui

ACM J. Emerg. Technol. Comput. Syst., 2022

Voltage Tuning for Reliable Computation in Emerging Resistive Memories.

Mahta Mayahinia, Atousa Jafari, Mehdi B. Tahoori

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Analyzing the Electromigration Challenges of Computation in Resistive Memories.

Mahta Mayahinia, Mehdi B. Tahoori, Manu Perumkunnil, Kristof Croes, Francky Catthoor

Proceedings of the IEEE International Test Conference, 2022

An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories.

Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan

Proceedings of the IEEE International Test Conference, 2022

A failure analysis framework of ReRAM In-Memory Logic operations.

Leon Brackmann, Atousa Jafari, Christopher Bengel, Mahta Mayahinia, Rainer Waser, Dirk J. Wouters, Stephan Menzel, Mehdi B. Tahoori

Proceedings of the IEEE International Test Conference in Asia, 2022

Adaptive Block Error Correction for Memristive Crossbars.

Surendra Hemaram, Mahta Mayahinia, Mehdi B. Tahoori

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric.

Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori

Proceedings of the IEEE European Test Symposium, 2022

MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories.

Atousa Jafari, Mahta Mayahinia, Soyed Tuhin Ahmed, Christopher Münch, Mehdi B. Tahoori

Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

Data Leakage through Self-Terminated Write Schemes in Memristive Caches.

Jonas Krautter, Mahta Mayahinia, Dennis R. E. Gnad, Mehdi B. Tahoori

Proceedings of the 27th Asia and South Pacific Design Automation Conference, 2022

2021

Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory.

Mahta Mayahinia, Christopher Münch, Mehdi B. Tahoori

Proceedings of the IEEE International Test Conference, 2021

2020

Efficient Organization of Digital Periphery to Support Integer Datatype for Memristor-Based CIM.

Mahdi Zahedi, Mahta Mayahinia, Muath Abu Lebdeh, Stephan Wong, Said Hamdioui

Proceedings of the 2020 IEEE Computer Society Annual Symposium on VLSI, 2020