Gurgen Harutunyan

According to our database, Gurgen Harutunyan authored at least 52 papers between 2005 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

An Efficient External Memory Test Solution: Case Study for HPC Application.

Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era.

Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor.

Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2023

Utilizing ECC Analytics to Improve Memory Lifecycle Management.

Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2023

On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI.

Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE European Test Symposium, 2023

2022

Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety.

Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories.

Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan

Proceedings of the IEEE International Test Conference, 2022

A Novel Protection Technique for Embedded Memories with Optimized PPA.

Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2022

2020

Memory Physical Aware Multi-Level Fault Diagnosis Flow.

Gurgen Harutyunyan, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian

IEEE Trans. Emerg. Top. Comput., 2020

Test and Diagnosis Solution for Functional Safety.

M. Casarsa, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2020

Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications.

Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan

Proceedings of the IEEE International Test Conference, 2020

2019

Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism.

Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Innovative Practices on In-System Test and Reliability of Memories.

S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Memory FIT Rate Mitigation Technique for Automotive SoCs.

Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2019

2018

Innovative practices on memory test practice.

M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications.

Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori

Proceedings of the IEEE International Test Conference, 2018

Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM.

Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2018

Advanced Uniformed Test Approach For Automotive SoCs.

Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2018

Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs.

Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides

Proceedings of the IEEE International Test Conference, 2018

Case Study and Advanced Functional Safety Solution for Automotive SoCs.

M. Casarsa, Gurgen Harutyunyan

Proceedings of the IEEE International Test Conference, 2018

2017

An effective functional safety solution for automotive systems-on-chip.

Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2017

Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs.

Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, I. Kroul, Hanna Shaheen, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2017

Advanced ECC solution for automotive SoCs.

Hanna Shaheen, Gabriele Boschi, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Experimental study on Hamming and Hsiao codes in the context of embedded applications.

Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

Automated flow for test pattern creation for IPs in SoC.

D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

An efficient testing methodology for embedded flash memories.

Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

Securing test infrastructure of system-on-chips.

Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

Extending fault periodicity table for testing external memory faults.

Gurgen Harutyunyan

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015

Impact of parameter variations on FinFET faults.

Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

An effective embedded test & diagnosis solution for external memories.

Gurgen Harutunyan, Yervant Zorian

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Overview study on fault modeling and test methodology development for FinFET-based memories.

Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

A power based memory BIST grouping methodology.

L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

2014

Fault modeling and test algorithm creation strategy for FinFET-based memories.

Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Extending fault periodicity table for testing faults in memories under 20nm.

Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013

An effective solution for building memory BIST infrastructure based on fault periodicity.

Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Integrating embedded test infrastructure in SRAM cores to detect aging.

W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters.

T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the East-West Design & Test Symposium, 2013

Impact of process variations on read failures in SRAMs.

Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the East-West Design & Test Symposium, 2013

Application of defect injection flow for fault validation in memories.

K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the East-West Design & Test Symposium, 2013

2012

A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs.

Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2011

Symmetry Measure for Memory Test and Its Application in BIST Optimization.

Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

J. Electron. Test., 2011

Generic BIST architecture for testing of content addressable memories.

Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

A Robust Solution for Embedded Memory Test and Repair.

K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

An efficient March test for detection of all two-operation dynamic faults from subclass Sav.

H. Avetisyan, Gurgen Harutyunyan, Valery A. Vardanian, Yervant Zorian

Proceedings of the 2010 East-West Design & Test Symposium, 2010

2008

An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories.

Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

2007

Minimal March Tests for Detection of Dynamic Faults in Random Access Memories.

Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian

J. Electron. Test., 2007

A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories.

Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

2006

Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories.

Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults.

T. A. Gyonjyan, Gurgen Harutunyan, Valery A. Vardanian

Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006

Minimal March Tests for Dynamic Faults in Random Access Memories.

Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian

Proceedings of the 11th European Test Symposium, 2006

Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories.

Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2005

Minimal March Tests for Unlinked Static Faults in Random Access Memories.

Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005