Augusto Tazzoli

According to our database, Augusto Tazzoli authored at least 15 papers between 2005 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2013

Neurocomputing and associative memories based on ovenized aluminum nitride resonators.

Vehbi Calayir, Tom Jackson, Augusto Tazzoli, Gianluca Piazza, Larry T. Pileggi

Proceedings of the 2013 International Joint Conference on Neural Networks, 2013

A -173 dBc/Hz @ 1 MHz offset Colpitts oscillator using AlN contour-mode MEMS resonator.

Jabeom Koo, Augusto Tazzoli, Jeronimo Segovai-Fernandez, Gianluca Piazza, Brian P. Otis

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2012

K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability.

Anna Persano, Augusto Tazzoli, Paola Farinelli, Gaudenzio Meneghesso, Pietro Siciliano, Fabio Quaranta

Microelectron. Reliab., 2012

2011

ESD sensitivity of a GaAs MMIC microwave power amplifier.

Augusto Tazzoli, Isabella Rossetto, Enrico Zanoni, Dai Yufeng, Tiziana Tomasi, Gaudenzio Meneghesso

Microelectron. Reliab., 2011

An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches.

Jacopo Iannacci, Alessandro Faes, A. Repchankova, Augusto Tazzoli, Gaudenzio Meneghesso

Microelectron. Reliab., 2011

Aluminum Nitride reconfigurable RF-MEMS front-ends.

Augusto Tazzoli, Matteo Rinaldi, Chengjie Zuo, Nipun Sinha, Jan Van der Spiegel, Gianluca Piazza

Proceedings of the 2011 IEEE 9th International Conference on ASIC, 2011

2010

Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform.

Augusto Tazzoli, Martina Cordoni, Paolo Colombo, C. Bergonzoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2010

Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches.

Augusto Tazzoli, Marco Barbato, F. Mattiuzzo, V. Ritrovato, Gaudenzio Meneghesso

Microelectron. Reliab., 2010

Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism.

Jacopo Iannacci, A. Repchankova, Alessandro Faes, Augusto Tazzoli, Gaudenzio Meneghesso, Gian-Franco Dalla Betta

Microelectron. Reliab., 2010

2009

Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology.

Augusto Tazzoli, Lorenzo Cerati, A. Andreini, Gaudenzio Meneghesso

Microelectron. Reliab., 2009

Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test.

Nicolo Ronchi, Franco Zanon, Antonio Stocco, Augusto Tazzoli, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2009

2008

Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields.

Augusto Tazzoli, Gaudenzio Meneghesso, Franco Zanon, Francesca Danesin, Enrico Zanoni, Philippe Bove, R. Langer, J. Thorpe

Microelectron. Reliab., 2008

Thermal storage effects on AlGaN/GaN HEMT.

Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini

Microelectron. Reliab., 2008

2007

Holding voltage investigation of advanced SCR-based protection structures for CMOS technology.

Augusto Tazzoli, Fabio Alessio Marino, Martina Cordoni, A. Benvenuti, Paolo Colombo, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2007

2005

A novel fast and versatile temperature measurement system for LDMOS transistors.

Augusto Tazzoli, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2005