Aymen Touati

According to our database, Aymen Touati authored at least 8 papers between 2014 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Scan-Chain Intra-Cell Aware Testing.

Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, Etienne Auvray

IEEE Trans. Emerg. Top. Comput., 2018

2017

Microprocessor Testing: Functional Meets Structural Test.

Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda

J. Circuits Syst. Comput., 2017

2016

Improving Functional and Structural Test Solutions for Integrated Circuits. (Amélioration des solutions de test fonctionnel et structurel des circuits intégrés).

Aymen Touati

PhD thesis, 2016

Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study.

Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2016

An effective approach for functional test programs compaction.

Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda

Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2016

2015

Scan-chain intra-cell defects grading.

Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

Exploring the impact of functional test programs re-used for power-aware testing.

Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

A Comprehensive Evaluation of Functional Programs for Power-Aware Test.

Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo Bernardi

Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014