Bernardo Borges Sandoval
Orcid: 0000-0001-5769-2974
According to our database1,
Bernardo Borges Sandoval authored at least 4 papers
between 2021 and 2026.
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Bibliography
2026
Mitigation of SETs Under Process Variability Effects: Circuit-Level Strategies for Reliable Design.
Proceedings of the 27th IEEE Latin American Test Symposium, 2026
2025
Evaluation of Transient Fault Tolerance in Different Logic Styles of 2: 1 Multiplexers.
Proceedings of the 16th IEEE Latin America Symposium on Circuits and Systems, 2025
2023
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023
2021
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study.
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021