Leonardo Heitich Brendler

According to our database, Leonardo Heitich Brendler authored at least 15 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications.

Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Frédéric Darracq, Frédéric Fauquet, Ricardo Reis, François Rivet

IEEE Trans. Circuits Syst. I Regul. Pap., December, 2023

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures.

Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt

Proceedings of the 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2023

A MCU-robust Interleaved Data/Detection SRAM for Space Environments.

Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Ricardo Reis, François Rivet

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2023

Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation.

Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

A Tool for Automatic Radiation-Hardened SRAM Layout Generation.

Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Ricardo Reis, François Rivet

Proceedings of the 30th IEEE International Conference on Electronics, Circuits and Systems, 2023

2021

Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study.

Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis, Cristina Meinhardt

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit.

Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis

Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021

2020

Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology.

Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

Circuit Level Design Methods to Mitigate Soft Errors.

Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes

Proceedings of the IEEE Latin-American Test Symposium, 2020

Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters.

Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis

Proceedings of the IEEE Latin-American Test Symposium, 2020

2019

Impact of Process Variability and Single Event Transient on FinFET Technology.

Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis

Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019

Evaluation of SET under Process Variability on FinFET Multi-level Design.

Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis

Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019

Process Variability Impact on the SET Response of FinFET Multi-level Design.

Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis

Proceedings of the VLSI-SoC: New Technology Enabler, 2019

2018

Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements.

Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis

Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018

Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells.

Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis

Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018